1998
DOI: 10.1109/94.729703
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Space charge in dielectrics. Energy storage and transfer dynamics from atomistic to macroscopic scale

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Cited by 58 publications
(26 citation statements)
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“…Many publications have pointed out that trapping cross sectional area corresponds to two factors: applied electric field 28 and trap depth 29,30 . An inverse power relationship between capture cross section area and average electric field has been found 28 .…”
Section: Trapping Cross-sectional Areamentioning
confidence: 99%
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“…Many publications have pointed out that trapping cross sectional area corresponds to two factors: applied electric field 28 and trap depth 29,30 . An inverse power relationship between capture cross section area and average electric field has been found 28 .…”
Section: Trapping Cross-sectional Areamentioning
confidence: 99%
“…Furthermore, there is some evidence 29,30 showing that in dielectrics, deeper traps should have a smaller cross section area. Physically, it can be explained that smaller capture radius will give rise to a greater Coulombic attractive force upon charge carrier, hence forming a deeper trap, which is harder for charge carrier to escape.…”
Section: Trapping Cross-sectional Areamentioning
confidence: 99%
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“…(7), the rate of charge capture by traps will be proportional to the density of mobile holes , unoccupied trap sites' density − ,where represents the a total traps density for holes, and is the drift velocity of charge carriers. Moreover, we correlate trapping cross section area with trap depth and local electric field [8,9].…”
Section: ) Volts-on Conditionmentioning
confidence: 99%
“…Physically, it can be explained that smaller capture radius will give rise to a greater coulombic attractive force upon on charge carrier, hence forming a deeper trap, which is harder for charge carrier to escape. Especially in [9], it was proposed that he binding energy of a coulombic trap to charge carrier is inversely proportional to radius of the trap . The binding energy directly determines the trap depth .…”
Section: Model Of Charge Dynamicsmentioning
confidence: 99%