1989
DOI: 10.1109/16.24363
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Space-charge-limited current in a film

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Cited by 132 publications
(113 citation statements)
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“…where 0 is a numerical constant of order unity [9]. For high aspect-ratio wires, the scaling factor induces a strong deviation from the bulk current density for which 9 / 8 .…”
Section: Nanowire Synthesismentioning
confidence: 99%
“…where 0 is a numerical constant of order unity [9]. For high aspect-ratio wires, the scaling factor induces a strong deviation from the bulk current density for which 9 / 8 .…”
Section: Nanowire Synthesismentioning
confidence: 99%
“…which is characteristic for the currents formed by injection of the carriers into an isolating material with two kinds of traps [8]. By plotting I(U) dependence in a double logarithmic scale, one can distinguish three sections characterized with different slopes and values of the exponent n ( Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The concentration of traps is given by N t , g corresponds to the degeneration factor, ε is material's dielectric constant, and N c is effective density of states in the conduction band [8]. All the samples featured electronic conductivity [9], so that the latter expression is useful for finding concentration of electrons in weaklycompensated semiconductor [5,6]:…”
Section: Resultsmentioning
confidence: 99%
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“…The space charge limited conduction (SCLC) 34,35 mechanism was investigated for the resistive switching device, and log J vs. log E plot was well fitted to a straight line. The current density and applied electric field relationship in SCLC conduction mechanism can be expressed as below,…”
Section: © 2017 Author(s) All Article Content Except Where Otherwismentioning
confidence: 99%