Spatial phase shifting for pure in-plane displacement and displacement-derivative measurements in electronic speckle pattern interferometry (ESPI)

Sirohi, R. S.; Burke, Jan; Helmers, Heinz; Hinsch, Klaus D.

doi:10.1364/ao.36.005787

Cited by 53 publications

(14 citation statements)

References 7 publications

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“…F½Iðf; yÞ ¼ Aðf; yÞ þ Cðf − f 0 − f s ; yÞ þ C Ã ðf þ f 0 þ f s ; yÞ: (13) In this case, only speckle pattern before the deformation is shifted by subtracting f 2 on frequency domain. Then, the specklegram as shown in Eq.…”

Section: Improvement By Shifting the Signal On Frequency Domainmentioning

confidence: 99%

“…The wrapped phase map detected by difference of phase method [11][12][13][14][15][16][17] is obtained in Fig. 7(a) by analyzing the same data shown in Figs.…”

Section: Detection Of Phase Map Of Deformationmentioning

confidence: 99%

“…In order to avoid such problems, a new method that can analyze phenomena by the minimum number of sheets of speckle patterns and that does not use any higher-speed camera has been required. [11][12][13][14][15] Generally, there are two kinds of analysis methods. 11 One is the method that would directly analyze speckle patterns.…”

mentioning

confidence: 99%

“…[11][12][13][14][15][16][17] The total deformation information is given from the difference between the phase maps of each speckle pattern. The idea of this analysis method is generally the same as the off-axis digital holography technology.…”

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confidence: 99%

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Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry

Arai

2014

Opt. Eng

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Abstract. High-resolution deformation measurement method, which requires only two speckle patterns in electronic speckle pattern interferometry, is proposed by using fringe analysis based on specklegram. In fringe analysis using the proposed optical system, a pair of real-and imaginary-part components concerning the deformation information is extracted from one speckle pattern by Fourier transform in the same manner as the off-axis digital holography processing. A specklegram is calculated as a fringe image by multiplying the components of the real and imaginary part of speckle patterns in order to perform a high-resolution deformation analysis. Then, the phase map concerning deformation is detected from the specklegram, and the influence of speckle noise is also reduced by shifting the component on frequency domain. Furthermore, the amplitude of the intensity distribution of speckle pattern is normalized in order to reduce the influence by speckle noise much more. It is confirmed that the accuracy of the deformation measurement is efficiently improved by the proposed noise reduction methods. © The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

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Section: Improvement By Shifting the Signal On Frequency Domainmentioning

confidence: 99%

“…The wrapped phase map detected by difference of phase method [11][12][13][14][15][16][17] is obtained in Fig. 7(a) by analyzing the same data shown in Figs.…”

Section: Detection Of Phase Map Of Deformationmentioning

confidence: 99%

mentioning

confidence: 99%

mentioning

confidence: 99%

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Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry

Arai

2014

Opt. Eng

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“…Generally, two analysis methods are used in speckle interferometry [11][12][13][14][15]. One is the 'difference of phase method' [11].…”

Section: Introductionmentioning

confidence: 99%

Electronic speckle pattern interferometry based on spatial information using only two sheets of speckle patterns

Arai

2014

Journal of Modern Optics

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Speckle interferometry is an important deformation measurement method for an object with a rough surface. In this paper, a novel fringe analysis method is proposed that uses a new optical system, which uses a plane wave as the reference beam of the speckle interferometer. When the optical system is employed in fringe analysis, the deformation information and the bias components of the speckle patterns are clearly separated in the frequency domain. Therefore, the deformation information can be readily extracted using a Fourier transform, which gives a pair of real and imaginary components concerning the information. The specklegram is calculated using such a pair of components, and the phase map is obtained from the specklegram. Experimental results confirmed that the resolution power of this measurement method is higher than 1/261 of the wavelength of the light source of the optical system.

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Speckle and Speckle Metrology

Joenathan

Tiziani

2004

Digital Encyclopedia of Applied Physics

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Speckles are a three-dimensional self interference pattern formed by a large number of random coherent waves. This results in a granular structure in free space or can be observed to be superposed on the image of the object and sets a fundamental limitation in high-resolution hologram microscopy and coherent imagery. Essentially, speckles are a randomly coded pattern that carries information about the object surface, and also has the rare distinction of being a nuisance and simultaneously a useful tool for measurement. Emergence of better measurement capabilities, newer recording media, faster computers and interfaces, and software has revitalized speckle metrology and has resulted in many fascinating new developments. Scores of books and review articles cover the myriads of applications and developments, and this chapter is intended to provide a concise and precise account of speckles starting from its infancy to the latest developments such as temporal speckle pattern interferometry or digital holography. Attractiveness of speckle methods lies in their ability to measure: large deformations, displacements with variable sensitivity to in-plane and out-of-plane, displacement derivatives, shape of a three-dimensional object, surface roughness, and dynamic displacement. Speckle techniques can nowadays be used to measure a wide range of displacement, sensitivities ranging from 0.25 µm to 150 µm for in-plane and 0.05 to 150 µm for out-of-plane displacements and with shearing techniques to over a 1000 µm. Speckle and Speckle MetrologyKeywords speckle; speckle photography; speckle interferometry; electronic speckle pattern interferometry; digital holography.

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Spatial phase shifting for pure in-plane displacement and displacement-derivative measurements in electronic speckle pattern interferometry (ESPI)

Cited by 53 publications

References 7 publications

Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry

Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry

Electronic speckle pattern interferometry based on spatial information using only two sheets of speckle patterns

Speckle and Speckle Metrology

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