2018
DOI: 10.1140/epjc/s10052-018-6454-0
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Spatially resolved dark count rate of SiPMs

Abstract: The Silicon Photomultiplier (SiPM) is a promising photo-detector for a variety of applications. However, the high dark count rate (DCR) of the SiPM is still a contemporary problem. Decreasing the DCR would significantly broaden the range of possible applications. In this work we present a novel method for the spatially resolved characterization of crystal defects in SiPMs. The contribution of crystal defects to the DCR is evaluated by exploiting the effect of "hot carrier luminescence" (HCL), which is light th… Show more

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Cited by 13 publications
(10 citation statements)
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“…This publication aims to study the emission spectra of the secondary photon emission outside the SiPM and its absolute secondary photon yield: number of photons (γ) emitted per charge carrier (e − ). Additionally, we investigate the uniformity of the light production over the entire SiPM surface area, identifying regions with heightened light emission intensity (hotspots), in agreement with other studies [22]. For this publication, we focused on two SiPMs, considered as photo-sensor candidates for the nEXO experiment: one Fondazione Bruno Kessler (FBK) VUVHD Low Field (LF) Low After Pulse (Low AP) SiPM (VUV-HD3) and one Hamamatsu Photonics (HPK) VUV4 Multi-Pixel Photon Counter (MPPC).…”
Section: Introductionsupporting
confidence: 84%
See 1 more Smart Citation
“…This publication aims to study the emission spectra of the secondary photon emission outside the SiPM and its absolute secondary photon yield: number of photons (γ) emitted per charge carrier (e − ). Additionally, we investigate the uniformity of the light production over the entire SiPM surface area, identifying regions with heightened light emission intensity (hotspots), in agreement with other studies [22]. For this publication, we focused on two SiPMs, considered as photo-sensor candidates for the nEXO experiment: one Fondazione Bruno Kessler (FBK) VUVHD Low Field (LF) Low After Pulse (Low AP) SiPM (VUV-HD3) and one Hamamatsu Photonics (HPK) VUV4 Multi-Pixel Photon Counter (MPPC).…”
Section: Introductionsupporting
confidence: 84%
“…The z -scales in Figure 4 a,b show that the HPK VUV4 SiPM tends to have brighter regions with enhanced light intensity (hotspots) compared to the FBK VUV-HD3, for which the hotspots appear more randomly distributed and within single SPADs. More generally the RMS of the light emission of the HPK MPPC is 3.3 times greater than that of the FBK SiPM, and behaves comparably to the one reported in [ 22 ] for KETEK PM3350T STD/MOD SiPM.…”
Section: Imaging Of the Biased Sipmsupporting
confidence: 76%
“…The output of SiPM sensors depends on the selected supply voltage that is in the range of 30–60 V [ 103 ]. Increasing the supply voltage increases the gain, but also increases the dark count, crosstalk, and after-pulses, which all lower the SNR [ 130 , 131 , 132 , 133 ].…”
Section: Detection Setups and Optical Sensor Technologymentioning
confidence: 99%
“…This distribution presents a plateau below and a fraction of defective SPADs close to 10%. These noisy SPADs are the result of abrupt variations in the doping concentration and defects in the crystal lattice that lead to higher avalanche probabilities and enhanced photo-emission [ 32 , 33 , 34 ]. Consequently, it is mandatory to model the SPAD yield as a function of the active area to quantify its effect in sensitivity.…”
Section: Pixel Optimizationmentioning
confidence: 99%