Specific features of the magnetoresistance in multilayer systems of magnetic nanoislands in weak magnetic fields

Boltaev, A. P.; Pudonin, F. A.; Sherstnev, I. A.

doi:10.1134/s1063783411050064

Cited by 21 publications

(12 citation statements)

References 6 publications

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“…[16]. During the deposition, the substrate temperature was 73 ± 3 ∘ C. The nominal film thickness (i.e., the thickness of the corresponding continuous film) was controlled by the deposition rate and time (see more details in [17]). We prepared the nanoisland FeNi films with nominal thickness varying from 0.6 to 2.0 nm.…”

Section: Introductionmentioning

confidence: 99%

Out-of-Plane and In-Plane Magnetization Behavior of Dipolar Interacting FeNi Nanoislands around the Percolation Threshold

Stupakov

Bagdinov

Прохоров

et al. 2016

Journal of Nanomaterials

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Magnetic properties of inhomogeneous nanoisland FeNi films were studied by SQUID magnetometry. The FeNi films with nominal thickness ranging from 0.6 to 2.0 nm were deposited by rf sputtering on Sitall glass substrates and covered by a protecting Al2O3 layer on the top. The SQUID data indicate pronounced irreversibility behavior for the out-of-plane temperature-dependent magnetization response (measured at H≃100 Oe) using zero-field cooling (ZFC) and field-cooled warming (FCW) after the applied dc magnetizing field Hm≃2 T for the FeNi samples with nominal thickness 1.1 nm ≲d≲1.8 nm, below the percolation threshold. The positive difference between the FCW and ZFC data identifies two irreversibility temperature scales, TB≈50 K and T⁎≈200 K, which can be associated with the superparamagnetic and superferromagnetic behavior in inhomogeneous nanoisland FeNi films, respectively. However, above the film percolation threshold, we observed a crossover from the out-of-plane to in-plane magnetization orientation. Here, the in-plane FCW-ZFC difference implies negative remanent magnetization response in the temperature range TB≲T≲T⁎. The observed magnetization properties can be associated with the presence of the superferromagnetic phase in self-assembled clusters of quasi-2D metallic magnetic FeNi nanoislands.

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Section: Introductionmentioning

confidence: 99%

Out-of-Plane and In-Plane Magnetization Behavior of Dipolar Interacting FeNi Nanoislands around the Percolation Threshold

Stupakov

Bagdinov

Прохоров

et al. 2016

Journal of Nanomaterials

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“…Ta film thickness was controlled by the deposition time. 10 We prepared a series of the Ta films, with a thickness of about 2.5, 5.0, 25, 33, 70, and 200 nm. Generally, microstructure of films grown by rf sputtering is thickness dependent.…”

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Interplay of electron correlations and localization in disordered β-tantalum films: Evidence from dc transport and spectroscopic ellipsometry study

Kovaleva

Chvostová

Bagdinov

et al. 2015

Applied Physics Letters

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Effect of palladium cap layer thickness on desorption of hydrogen from PrH x films: A spectroscopic ellipsometry study J. Appl. Phys. 90, 1795 (2001); 10.1063/1.1385569Determining thickness of thin metal films with spectroscopic ellipsometry for applications in magnetic randomaccess memory Transition from strong to weak electron localization in a percolating gold film under the influence of an electric field Low Temp.

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“…The lateral sizes of the islands are 5 -30 nm, and the distance between them is 1 -5 nm. It was shown that in the multilayer structures of periodically alternating layers of nanoislands and continuous layers, they do not mix [10]. This is verified by the X-ray reflectivity showing three Bragg peaks in evidence of a good periodicity.…”

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confidence: 82%

“…It was shown that in periodic nanoisland multilayer structures, the island layer mixing is insignificant [10]. However, since nanoislands of neighboring layers are practically in contact with each other, the nanoisland metallic multilayer structure will be percolating.…”

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confidence: 99%

Localization effects in the disordered Ta interlayer of multilayer Ta-FeNi films: Evidence from dc transport and spectroscopic ellipsometry study

Kovaleva,

Chvostova,

Pacherova

et al. 2021

Preprint

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Using dc transport and wide-band spectroscopic ellipsometry techniques, we study localization effects in the disordered metallic Ta interlayer of different thickness in the multilayer films (MLFs) (Ta -FeNi) N grown by rf sputtering deposition. In the grown MLFs, the FeNi layer was 0.52 nm thick, while the Ta layer thickness varied between 1.2 and 4.6 nm. The Ta layer dielectric function was extracted from the Drude-Lorentz simulation. The dc transport study of the MLFs implies non-metallic (dρ/dT < 0) behavior, with negative temperature coefficient of resistivity (TCR). The TCR absolute value increases upon increasing the Ta interlayer thickness, indicating enhanced electron localization. With that, the free charge carrier Drude response decreases. Moreover, the pronounced changes occur at the extended spectral range, involving the higher-energy Lorentz bands. The Drude dc conductivity drops below the weak localization limit for the thick Ta layer.The global band structure reconstruction may indicate the formation of a nearly localized manybody electron state.

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Specific features of the magnetoresistance in multilayer systems of magnetic nanoislands in weak magnetic fields

Cited by 21 publications

References 6 publications

Out-of-Plane and In-Plane Magnetization Behavior of Dipolar Interacting FeNi Nanoislands around the Percolation Threshold

Out-of-Plane and In-Plane Magnetization Behavior of Dipolar Interacting FeNi Nanoislands around the Percolation Threshold

Interplay of electron correlations and localization in disordered β-tantalum films: Evidence from dc transport and spectroscopic ellipsometry study

Localization effects in the disordered Ta interlayer of multilayer Ta-FeNi films: Evidence from dc transport and spectroscopic ellipsometry study

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