Speckle intensity and phase gradients: influence on fringe quality in spatial phase shifting ESPI-systems

Burke, Jan; Helmers, Heinz; Kunze, Charlotte; Wilkens, Verena

doi:10.1016/s0030-4018(98)00144-8

Cited by 38 publications

(18 citation statements)

References 15 publications

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“…The wrapped phase map detected by difference of phase method [11][12][13][14][15][16][17] is obtained in Fig. 7(a) by analyzing the same data shown in Figs.…”

Section: Detection Of Phase Map Of Deformationmentioning

confidence: 99%

“…In order to avoid such problems, a new method that can analyze phenomena by the minimum number of sheets of speckle patterns and that does not use any higher-speed camera has been required. [11][12][13][14][15] Generally, there are two kinds of analysis methods. 11 One is the method that would directly analyze speckle patterns.…”

mentioning

confidence: 99%

“…[11][12][13][14][15][16][17] The total deformation information is given from the difference between the phase maps of each speckle pattern. The idea of this analysis method is generally the same as the off-axis digital holography technology.…”

mentioning

confidence: 99%

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Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry

Arai

2014

Opt. Eng

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Abstract. High-resolution deformation measurement method, which requires only two speckle patterns in electronic speckle pattern interferometry, is proposed by using fringe analysis based on specklegram. In fringe analysis using the proposed optical system, a pair of real-and imaginary-part components concerning the deformation information is extracted from one speckle pattern by Fourier transform in the same manner as the off-axis digital holography processing. A specklegram is calculated as a fringe image by multiplying the components of the real and imaginary part of speckle patterns in order to perform a high-resolution deformation analysis. Then, the phase map concerning deformation is detected from the specklegram, and the influence of speckle noise is also reduced by shifting the component on frequency domain. Furthermore, the amplitude of the intensity distribution of speckle pattern is normalized in order to reduce the influence by speckle noise much more. It is confirmed that the accuracy of the deformation measurement is efficiently improved by the proposed noise reduction methods. © The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

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“…The wrapped phase map detected by difference of phase method [11][12][13][14][15][16][17] is obtained in Fig. 7(a) by analyzing the same data shown in Figs.…”

Section: Detection Of Phase Map Of Deformationmentioning

confidence: 99%

mentioning

confidence: 99%

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Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry

Arai

2014

Opt. Eng

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“…In many cases, the visual aspect of the fringes, that represent regions of equal displacement, can provide enough information in the analysis of a given experiment. In order to know the quantitative phase difference value, spatial phase shifting (SPS) can be introduced (Burke et al, 1998;Creath, 1985). It is based on the addition of a known phase 184 function called phase carrier.…”

Section: Digital Speckle Pattern Interferometry (Dspi)mentioning

confidence: 99%

Application of Optical Techniques in the Characterization of Thermal Stability and Environmental Degradation in High Temperature Superconductors

Angurel¹,

Andrés²,

Pilar³

et al. 2010

Superconductor

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“…Due to the greatly improved performance of SPS (frames d, e, f-under the same conditions) we decided therefore to implement this arrangement whenever possible. Comparison of both the static images (frames a and d), however, illustrates that under stable conditions SPS performs slightly inferior due to residual fluctuating speckle phase over the three pixels compared [8]. For an overall displacement map characterizing the process under investigation the steps in the mod2p-maps have to be eliminated-a procedure called spatial phase unwrapping.…”

Section: Article In Pressmentioning

confidence: 99%

Checkup for aging artwork—Optical tools to monitor mechanical behaviour

Hinsch¹,

Gülker²,

Helmers³

2007

Optics and Lasers in Engineering

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Speckle intensity and phase gradients: influence on fringe quality in spatial phase shifting ESPI-systems

Cited by 38 publications

References 15 publications

Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry

Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry

Application of Optical Techniques in the Characterization of Thermal Stability and Environmental Degradation in High Temperature Superconductors

Checkup for aging artwork—Optical tools to monitor mechanical behaviour

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