Spectroscopic Ellipsometry and Atomic Force Microscopy of Polyphenylene Oxide Films

Abstract

Polyphenylene oxide (PPO) films electrochemically deposited on highly oriented pyrolytic graphite (HOPG) have been investigated by spectroscopic ellipsometry (SE) and atomic force microscopy (AFM). The optical properties of the substrate and film were measured over the visible and near UV spectral ranges. PPO film thicknesses were deduced from SE measurements and compared to results obtained by AFM. Spin cast linear PPO films were also measured. We demonstrate the AFM measurements are concordant with and useful for the interpretation of the ellipsometric measurements. The refractive index in the visible light region for the electrodeposited PPO films is 1.721 -i 0.006 and for the linear PPO films is 1.698 -i0.028.

Understanding the intrinsic water wettability of graphite

“…At 1.996 eV, our measured n and k are 3.202 ± 0.030 and 1.836 ± 0.027, respectively, matching well with literature values. 324 Surface adsorption of hydrocarbons does not affect the optical constants of HOPG (Table 21). The HOPG optical constants were then fixed during modeling of the adsorbed hydrocarbon layer.…”

“…The "one-film" model approach is well documented and applicable to systems with a constant substrate (e.g., HOPG) and a film over-layer (e.g., hydrocarbon). 324 See Figure 30c for the a schematic of the "one-film" model. …”

Estudo das propriedades eletrônicas e ópticas de filmes e dispositivos poliméricos.

“…No intervalo de energia onde k ≈ 0 (ou k muito menor que n), a equação de LorenzLorentz [63,[83][84][85][86][87][88][89][90][91][92][93][94][95][96] (LL) oferece a possibilidade de se calcular o valor de n de um polímero desconhecido se as frações (R j ) e os volumes (V j ) molares dos seus grupos funcionais são conhecidos. Nesse caso, n pode ser obtido a partir da equação: (ii) para um estágio intermediário, i.e.…”