We report on the first experimental observation of an apparent metal insulator transition in a 2D electron gas confined in an InAs quantum well. At high densities we find that the carrier mobility is limited by background charged impurities and the temperature dependence of the resistivity shows a metallic behavior with resistivity increasing with increasing temperature. At low densities we find an insulating behavior below a critical density of nc = 5 × 10 10 cm −2 with the resistivity decreasing with increasing temperature. We analyze this transition using a percolation model arising from the failure of screening in random background charged impurities. We also examine the percolation transition experimentally by introducing remote ionized impurities at the surface. Using a bias during cool-down, we modify the screening charge at the surface which strongly affects the critical density. Our study shows that transition from a metallic to an insulating phase in our system is due to percolation transition.The metallic behavior of the resistivity observed at low temperatures in low-disorder two-dimensional (2D) systems is a topic of great interest in condensed matter physics. The scaling theory of localization predicts a noninteracting two-dimensional system in the presence of finite disorder is an insulator at zero temperature in the thermodynamic limit [1]. Indeed early experiments confirmed that in highly-disordered two dimensional electron systems (2DESs) the resistivity shows an insulating logarithmic temperature dependence [2]. The scaling theory was challenged by the observation of an apparent metalinsulator transition in high-mobility electron inversion layers in Si metal-oxide-semiconductor-field-effect transistors (MOSFETs) and later in several other 2D semiconductor systems [3,4]. At higher densities, a metallic temperature dependence of the resistivity, ρ, and a concomitant transition to an insulating phase at lower densities were observed. This apparent metal insulator transition (MIT) is marked by a "critical carrier density", n c which characterizes the crossover from the higherdensity metallic temperature dependence of the resistivity to the lower-density insulating temperature dependence. For n > n c , the system exhibits a metallic behavior (dρ/dT>0) while for n < n c , the resistivity increases with decreasing temperature and dρ/dT<0 in the insulating phase.In the past twenty years, MIT has been observed in a wide variety of 2D carrier systems such as n-Si MOSFETs [3], n-GaAs [5, 6], p-GaAs [7-9], n-Si/SiGe [10, 11], pSi/SiGe [12, 13] and n-AlAs [14,15]. In the current work we present the first experimental observation of 2D MIT in a narrow gap semiconductor, namely, 2D electrons confined in InAs quantum wells. We believe that our work is also the observation of the 2D MIT phenomenon in a material with the lowest value of the dimensionless electron interaction coupling parameter r s (∼ 2). Narrow band-gap materials such as InAs are particularly interesting as they have strong spin-orbit coupling,...