2004
DOI: 10.1016/j.msea.2003.11.063
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Sputter deposition of NiTi to investigate the Ti loss rate as a function of composition from cast melted targets

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Cited by 20 publications
(15 citation statements)
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“…The composition of all films was determined as about Ni 50.1 Ti 49.9 (±0.1 at %). Comparing target and thin film compositions, we note a loss of Ti during deposition, which is a well-known effect [20].…”
Section: Methodsmentioning
confidence: 66%
“…The composition of all films was determined as about Ni 50.1 Ti 49.9 (±0.1 at %). Comparing target and thin film compositions, we note a loss of Ti during deposition, which is a well-known effect [20].…”
Section: Methodsmentioning
confidence: 66%
“…10,13) Thin films of NiTi were deposited at 450 C in the crystalline state on silicon substrates using a vonArdenne CS730 sputtering cluster machine at a typical deposition rate of 13 mm/h. The base vacuum was about 1 Â 10 À5 Pa. Due to the different angular sputtering distributions for nickel and titanium the film composition deviates from the composition of the target.…”
Section: Methodsmentioning
confidence: 99%
“…In correspondence with analysis results published in our previous work, for the employed sputtering geometry a typical loss rate of 4-4.5 at% Ti between cast-melted target and sputter deposited film was found. 10) Consequently, the target composition was chosen to be Ti-53.5 at%Ni-46.5 at% in order to obtain a composition of Ti-49 at%Ni-51 at% in the films. Care has been taken to minimize oxygen contamination during the cast-melting process for target preparation as well as for the sputtering system.…”
Section: Methodsmentioning
confidence: 99%
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“…They can be evaluated by, for example, the cantilever method [9] or differential scanning calorimetry (DSC) [10]. However, DSC has a low throughput, as it measures a single sample of a thick freestanding film at a time, and is not suitable for thin films with a low hysteresis [11].…”
Section: Introductionmentioning
confidence: 99%