2011
DOI: 10.1088/0022-3727/44/34/345501
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Sputter yield amplification by tungsten doping of Al2O3 employing reactive serial co-sputtering: process characteristics and resulting film properties

Abstract: The deposition rate of reactively sputtered Al 2 O 3 coatings is demonstrated to increase by 80% upon Tungsten doping of the Aluminum target utilized. This effect is based on the recoil of the sputtering species at implanted dopants below the target surface and is termed Sputter Yield Amplification. For the investigation of this effect, a novel type of magnetron sputter deposition system has been employed that facilitates serial co-sputtering. In this technique doping of the elementary target is enabled by a d… Show more

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Cited by 13 publications
(4 citation statements)
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“…W) to the target material [8]. This effect originates in a reduction of the implantation depth of the light element due to an increased stopping power and is known as "sputter yield amplification" (SYA) [9].…”
Section: Introductionmentioning
confidence: 99%
“…W) to the target material [8]. This effect originates in a reduction of the implantation depth of the light element due to an increased stopping power and is known as "sputter yield amplification" (SYA) [9].…”
Section: Introductionmentioning
confidence: 99%
“…2 shows the dependency of the deposition rate on Ti content of MoTi alloys with high Ti contents. The deposition rate of MoTi90 is almost 40% higher compared to pure Ti which can be explained by the sputter yield amplification effect [1].…”
Section: Molybdenum Titanium Based Sputter Targets For Tft Applicationmentioning
confidence: 99%
“…Here, TCO can be doped with an additional element to manipulate the device properties. [17][18][19] In particular, the serial cosputtering technique introduced by Belkind 20) showed benefits such as the sputter amplification yield effect, 21,22) and an advanced concept was shown by Fraunhofer-Institut für Schicht-und Oberflächentechnik IST. 23) Serial cosputtering in an in-line setup has until now not been shown to be applicable to the production of window layers for CIGS solar cells.…”
Section: Introductionmentioning
confidence: 99%