2008
DOI: 10.1109/asmc.2008.4529077
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SRAM Redundancy - Silicon Area versus Number of Repairs Trade-off

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Cited by 11 publications
(6 citation statements)
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“…Regarding the core, we note that DVFS becomes harder to use due to the need for decreased voltage for energy savings and increased minimum operating voltage to tolerate process variations [Bickford et al 2008]. As a consequence, the acceptable voltage range narrows down in each technology generation.…”
Section: Putting It All Togethermentioning
confidence: 99%
“…Regarding the core, we note that DVFS becomes harder to use due to the need for decreased voltage for energy savings and increased minimum operating voltage to tolerate process variations [Bickford et al 2008]. As a consequence, the acceptable voltage range narrows down in each technology generation.…”
Section: Putting It All Togethermentioning
confidence: 99%
“…In particular, smaller geometries suffer from process variations, which limit the minimum voltage that can be used [Bickford et al 2008]. On the other hand, power efficiency and heat dissipation push for lower operating voltages.…”
Section: Voltage and Temperature Aware Energy Meteringmentioning
confidence: 99%
“…Although voltage and temperature parameters may impact energy consumption of PTEM, their variability is expected to decrease with technology scaling and the increasing number of cores per chip. In particular, smaller geometries suffer from process variations, which limit the minimum voltage that can be used [Bickford et al 2008]. On the other hand, power efficiency and heat dissipation push for lower operating voltages.…”
Section: Voltage and Temperature Aware Energy Meteringmentioning
confidence: 99%