Organic field-effect transistors (OFETs) were fabricated
using
three high-surface area and flexible expanded-poly(tetrafluoroethylene)
(ePTFE) membranes in gate dielectrics, along with the semiconducting
polymer poly[2,5-bis(2-octyldodecyl)pyrrolo[3,4-c]pyrrole-1,4(2H,5H)-dione-3,6-diyl)-alt-(2,2′:5′,2″:5″,2‴-quaterthiophen-5,5‴-diyl)]
(PDPP4T). The transistor behavior of these devices was investigated
following annealing at 50, 100, 150, and 200 °C, all sustained
for 1 h. For annealing temperatures above 50 °C, the OFETs displayed
improved transistor behavior and a significant increase in output
current while maintaining similar magnitudes of V
th shifts when subjected to static voltage compared to
those kept at ambient temperature. We also tested the response to
NO2 gas for further characterization and for possible applications.
The ePTFE–PDPP4T interface of each membrane was characterized
via scanning electron microscopy for all four annealing temperatures
to derive a model for the hole mobility of the ePTFE–PDPP4T
OFETs that accounts for the microporous structure of the ePTFE and
consequently adjusts the channel width of the OFET. Using this model,
a maximum hole mobility of 1.8 ± 1.0 cm2/V s was calculated
for the polymer in an ePTFE–PDPP4T OFET annealed at 200 °C,
whereas a PDPP4T OFET using only the native silicon wafer oxide as
a gate dielectric exhibited a hole mobility of just 0.09 ± 0.03
cm2/V s at the same annealing condition. This work demonstrates
that responsive semiconducting polymer films can be deposited on nominally
nonwetting and extremely bendable membranes, and the charge carrier
mobility can be significantly increased compared to their as-prepared
state by using thermally durable polymer membranes with unique microstructures
as gate dielectrics.