The size and emission wavelength of self-assembled InAs/ InP͑001͒ quantum wires (QWrs) is affected by the P / As exchange process. In this work, we demonstrate by in situ stress measurements that P / As exchange at the InAs/ InP interface depends on the surface reconstruction of the InAs starting surface and its immediate evolution when the arsenic cell is closed. Accordingly, the amount of InP grown on InAs by P / As exchange increases with substrate temperature in a steplike way. These results allow us to engineer the size of the QWr for emission at 1. InAs/ InP quantum wires (QWrs) or quantum dots (QDs) are very promising for optoelectronic devices operating in the 1.30-1.55 m wavelength range employed in fiber optical telecommunications systems. 1-3 However, these nanostructures have not been as extensively exploited as InAs/ GaAs QD partly due to the intrinsic peculiarities of the interface between III-V A / III-V B compounds: On one hand, an asymmetric stress appears at the InAs/ InP interface; 4 on the other hand, complicated V A /V B exchange processes take place during epitaxial growth. Although P / As exchange has been widely studied, 5-15 a deeper understanding of this process is still needed since it determines the size of the nanostructures, governing their emission wavelength.In this work, we have carried out in situ and in real-time stress measurements on an InAs(001) surface exposed to a P 2 flux at different substrate temperatures T s in order to quantify the P / As exchange effect. We have observed a strong dependence on T s of the amount of InP formed (that is, grown without In delivering) during P 2 exposure in the 330-515°C range. We prove that this behavior is directly related to the InAs surface reconstruction, which depends on temperature for a fixed arsenic pressure. Finally, we show that such InAs/ InP surface dynamics can be used to engineer the size distribution of the nanostructures ensemble. To demonstrate this capability, we have studied the optical properties of the InAs QWr as a function of the growth temperature of the InP cap layer, T C . A redshift of the photoluminescence (PL) spectrum is observed as the T C decreases. The size reduction responsible for the observed change in emission energy has been directly demonstrated by transmission electron microscopy (TEM).The P / As exchange process has been assessed by in situ and in real-time measurements of the stress evolution during P 2 exposure of an InAs (001) surface through the optical monitorization of the substrate curvature. This in situ technique provides a direct measurement of the film accumulated stress, ⌺ (stress integrated along the layer thickness). 4 We have used thinned ͑175 m͒ InAs substrates, elongated along the [110] axis to detect stress variations in this direction, in which the whole amount of incorporated InP can be quantified. 5 The phosphorous and arsenic beam equivalent pressures (BEPs) used in these experiments were BEP͑P 2 ͒ = 2.37ϫ 10 −5 mbar and BEP͑As 4 ͒ = 0.53ϫ 10 −5 mbar. Simultaneous reflectance...