1986
DOI: 10.1017/s0885715600011969
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Standard Reference Materials for X-Ray Diffraction Part I. Overview of Current and Future Standard Reference Materials

Abstract: Standard Reference Materials (SRM) are stable materials which have one or more properties certified by the National Bureau of Standards. A general introduction is given to the types of SRM's and their certification. SRM's for X-ray diffraction are described in detail, including their intended use and their certified and other properties. New SRM's are under consideration as quantitative standards, intensity and line shape standards, and materials properties standards.

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Cited by 24 publications
(12 citation statements)
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“…The National Institute of Standards and Technology (NIST) has produced and issued several standard reference materials (SRMs) for powder diffraction measurements, one of which, SRM 675 (fluorophlogopite, KMg3Si3AIOloF2) , is intended for use as a low-angle (large d spacing) calibration standard. SRM 675, however, has only two peaks below 20 °, at 8.85 and 17.75 °, with d spacings of 9.981 and 4.9905 A, respectively (Hubbard, 1983a;Dragoo, 1986). Because of the recent interest in the characterization of materials with very large d spacings/periodicities, it is necessary to develop a new low-angle diffraction standard which has well defined diffraction peaks down to very small 20 angles of a few degrees and less.…”
Section: Introductionmentioning
confidence: 99%
“…The National Institute of Standards and Technology (NIST) has produced and issued several standard reference materials (SRMs) for powder diffraction measurements, one of which, SRM 675 (fluorophlogopite, KMg3Si3AIOloF2) , is intended for use as a low-angle (large d spacing) calibration standard. SRM 675, however, has only two peaks below 20 °, at 8.85 and 17.75 °, with d spacings of 9.981 and 4.9905 A, respectively (Hubbard, 1983a;Dragoo, 1986). Because of the recent interest in the characterization of materials with very large d spacings/periodicities, it is necessary to develop a new low-angle diffraction standard which has well defined diffraction peaks down to very small 20 angles of a few degrees and less.…”
Section: Introductionmentioning
confidence: 99%
“…Mainly, attention has been paid to both research on standard reference materials (SRMs) and the establishment of correct evaluation procedures in combination with suitable measurement strategies. Dragoo (1986) has presented an overview of SRMs for X-ray powder diffraction, in which the silicon powder 640 and the corundum powder 674 (one of a set of ®ve substances) used in the present study are described. Wong-Ng & Hubbard (1987) enhanced the characterization by making detailed suggestions for the handling of these two SRMs in external and internal calibration procedures.…”
Section: Introductionmentioning
confidence: 99%
“…The National Institute of Standards and Technology (NIST) has issued a low-angle calibration standard reference material (SRM), SRM675 (fluorophlogopite, KMg3Si 3 AlO 10 F2). Using CuKa, radiation, SRM 675 has only two peaks below 20° 26, at 8.85 and 17.76°, with d spacings of 9.981 and 4.9905 A, respectively (Hubbard, 1983;Dragoo, 1986). As a result of the interest in characterization of materials with large d spacings/layer periodicities, it has become necessary to consider developing a low-angle diffraction standard which has well-defined diffraction peaks down to 26 angles of a few degrees.…”
Section: Introductionmentioning
confidence: 99%