1993
DOI: 10.1107/s0021889892009762
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X-ray powder diffraction analysis of silver behenate, a possible low-angle diffraction standard

Abstract: Silver behenate, a possible low‐angle diffraction standard, was characterized using the powder diffraction technique. Diffraction patterns obtained with 1.54 Å synchrotron and Cu Kα radiations showed thirteen regularly spaced (00l) peaks in the range 1.5–20.0°2θ. With the National Institute of Standards and Technology's standard reference material silicon as an internal standard, the long spacing of silver behenate was accurately determined from the profile‐fitted synchrotron diffraction peaks, with d001 = 58.… Show more

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Cited by 607 publications
(521 citation statements)
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“…External calibration to convert the measured 4096 channels to 2θ degrees was applied using cubic Na 2 Ca 2 Al 2 F 4 (high angle calibration) 39 mixed with silver behenate (low angle calibration). 40 The time of acquisition was set to 17 h to obtain reflections with exploitable intensities.…”
Section: Methodsmentioning
confidence: 99%
“…External calibration to convert the measured 4096 channels to 2θ degrees was applied using cubic Na 2 Ca 2 Al 2 F 4 (high angle calibration) 39 mixed with silver behenate (low angle calibration). 40 The time of acquisition was set to 17 h to obtain reflections with exploitable intensities.…”
Section: Methodsmentioning
confidence: 99%
“…To calculate the d-spacing from the 2D images, silver behenate diffraction peaks were used as an external reference. 25 …”
Section: Saxs Using Synchrotron Microbeam X-ray Radiationmentioning
confidence: 99%
“…The sample-to-detector distance was 1.9 m, which leads to the scattering vector range 0.1 nm − < s < 3.55 nm −1 . The detector s-axis was calibrated using silver behenate [23]. The data were normalized, corrected for detector response and integrated using SAXS data reduction software Bli711 [22].…”
Section: Saxsmentioning
confidence: 99%