1951
DOI: 10.6028/jres.046.036
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Standard x-ray diffraction patterns

Abstract: Improve ment of t he X -ray diffraction pattern file of t he America n Society fo r T esti ng M aterials is t he bas is for work being don e at t he N ational Bureau of Standards wi t h t he cooperat ion of t he Joint Co mmi ttee on Che mical Analysis by X -ray Diffraction Methods of t he Ameri can Society for T est ing Materials , t he America n Cr ystallographic Associa t ion, an d t he Bri tish Inst it ute of Phy sics. The equipment used in obtainin g t he d ata presented her e comprises a Geiger-count er s… Show more

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Cited by 268 publications
(287 citation statements)
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“…In addition, new scatterers emerge (Table 2 and Supplementary Fig. 4) increases the coordination number of Fe-Fe at 2.53 Å, which is consistent with the formation of metallic iron 28 . The exposure of the reduced sample to FTS conditions slightly reduces the contribution of Fe-Fe at around 2.53 Å and at the same time leads to a substantial increase in the long-distance iron scatterers.…”
Section: Synthesis and Characterizationsupporting
confidence: 71%
“…In addition, new scatterers emerge (Table 2 and Supplementary Fig. 4) increases the coordination number of Fe-Fe at 2.53 Å, which is consistent with the formation of metallic iron 28 . The exposure of the reduced sample to FTS conditions slightly reduces the contribution of Fe-Fe at around 2.53 Å and at the same time leads to a substantial increase in the long-distance iron scatterers.…”
Section: Synthesis and Characterizationsupporting
confidence: 71%
“…Cubic In 2 O 3 appears as the only phase in samples grown at T S у300°C. 18 ͒ seems to depend on T S during growth and on air annealing temperature (T A ), the observed values ranging from 10.149 to 10.110 Å. The samples deposited at lower temperatures present a lattice constant larger than those deposited at higher temperatures or annealed at 400°C, with the exception of sample ITO 10, deposited at 400°C and presenting aϭ10.140 Å.…”
Section: Resultsmentioning
confidence: 95%
“…There are also additional peaks from the back contact, Mo [10]. The relative peak intensities deviate from the powder reference of ZnS (and CZTS) in a way which indicates that the films have a (111) orientation with the close packed plane parallel to the surface (corresponding to (112) orientation for CZTS).…”
Section: Resultsmentioning
confidence: 98%