Standardization of proton induced X-ray emission for analysis of trace elements in thick samples

Abstract

This paper presents the standardization of Proton Induced X-rays Emission (PIXE) technique for the trace element analysis of thick standard samples. Three standard reference materials (SRMs) viz-à-vis titanium, copper and iron base alloys were used for the study due to their availability. The protons beam was accelerated up to 2.57 MeV energy by 5UDH-II tandem Pelletron accelerator and samples were irradiated at different geometry and durations. Spectrum was acquired using a multi-channel spectrum analyzer while spectrum analysis was done using a GUPIXWIN model for determination of elemental concentrations of trace elements. The obtained experimental data was compared with theoretical data and results were found in close agreement.

Trace Elements Analysis by Pixe Spectroscopy

“…[8] In the case if: 2    the time t when the photon impacts the detector can be found from the equation [8] as:…”