2014
DOI: 10.1109/tpel.2013.2288334
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State Detection of Bond Wires in IGBT Modules Using Eddy Current Pulsed Thermography

Abstract: Insulated gate bipolar transistor (IGBT) modules are important safety critical components in electrical power systems. Bond wire lift-off, a plastic deformation between wire bond and adjacent layers of a device caused by repeated power/thermal cycles, is the most common failure mechanism in IGBT modules. For the early detection and characterisation of such failures, it is important to constantly detect or monitor the health state of IGBT modules, and the state of bond wires in particular. This paper introduces… Show more

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Cited by 167 publications
(60 citation statements)
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References 48 publications
(49 reference statements)
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“…[10][11][12][13] For example, bonding pressure of microelectronics packaging equipment needs to be applied to the stable load of 5N, [14][15][16][17][18] and damping force of micro-mechanical damping system is only 20N. 19,20 Recently, some small MRF dampers are developed, such as the RD-1097-01X damper is the smallest commercial damper, whose force is still 100N.…”
Section: Introductionmentioning
confidence: 99%
“…[10][11][12][13] For example, bonding pressure of microelectronics packaging equipment needs to be applied to the stable load of 5N, [14][15][16][17][18] and damping force of micro-mechanical damping system is only 20N. 19,20 Recently, some small MRF dampers are developed, such as the RD-1097-01X damper is the smallest commercial damper, whose force is still 100N.…”
Section: Introductionmentioning
confidence: 99%
“…Selection of the approach to reliability design and condition monitoring for electronic products has been an evolutionary process [9]. At present, nondestructive testing techniques are reported in use such as scanning acoustic tomography [11] and active thermography [12].Some thermal or electrical parameters are also adopted to monitor the degradation of power modules, and this method mainly concentrates on the surface response [13], or the transient electric parameters which are internal-failure-sensitive parameters [14][15][16][17][18]. Ref.…”
Section: Introductionmentioning
confidence: 99%
“…Material failures like defect, fatigue, corrosion and residual stress, etc. have been detected and evaluated using ECPT [3,4].…”
Section: Introductionmentioning
confidence: 99%