Scanning Probe Microscopy-Physical Property Characterization at Nanoscale 2012
DOI: 10.5772/36461
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Statistical Analysis in Homopolymeric Surfaces

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Cited by 3 publications
(3 citation statements)
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“…We used, in the present investigation, UV-Vis absorption, photoluminescence and ellipsometry emission. As a result, we assign the use of an alternative optical characterization to probe the organic semiconductors obtained via electrochemical techniques [20,23].…”
Section: Introductionmentioning
confidence: 99%
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“…We used, in the present investigation, UV-Vis absorption, photoluminescence and ellipsometry emission. As a result, we assign the use of an alternative optical characterization to probe the organic semiconductors obtained via electrochemical techniques [20,23].…”
Section: Introductionmentioning
confidence: 99%
“…Since the physical-chemistry properties and investigation of organic active layers, such as P3ATs thin solid ilms, can elucidate the development of new optoelectronic devices [16][17][18]. Interface efects cause signiicant quenching of excited carriers and it is commonly investigated by conventional spectroscopic techniques [15,19], such as ultraviolet-visible absorption (UV-Vis), photoluminescence (PL), photoluminescence excitation (PLE), vibrational spectroscopy (FT-IR and RAMAN) [8,12,20,21] and the morphological technique of atomic force microscopy (AFM) [22][23][24]. In the case of energy transfer processes of excited carriers, the analysis of polarization of emited light can be directly correlated with polymeric chain position parallel to the direction of the transition dipole moment [25][26][27].…”
Section: Introductionmentioning
confidence: 99%
“…[12] Scattering techniques have also been used for analyzing the surface roughness. [13] Eraldo Riberiro and Mubarak Shah [14] has mentioned the use of texture analysis to characterize nanoscale materials as one of the possible avenues for future research in nanoscale imaging. Q-Lin et al [15] and Yadav et al [16] have made attempts to use a multifractal analysis [17,18] to measure the surface morphology of thin films from the multifractal spectra of the thin film.…”
Section: Introductionmentioning
confidence: 99%