Statistical Signal Integrity Analysis and Diagnosis Methodology for High-Speed Systems

Matoglu, E.; Pham, N.; Araujo, D.N. de; Cases, M.; Swaminathan, Madhavan

doi:10.1109/tadvp.2004.831856

Cited by 65 publications

(33 citation statements)

References 15 publications

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“…To calculate the percentage contribution p% for each factor will be very exhaustive. Alternately we can use the matrix methods used in literature [7], which are basically Ordinary Least Square (OLS) methods. Following are the matrix method equations (1 2) used to find the sensitivity coefficients for each parameter.…”

Section: Discussionmentioning

confidence: 99%

“…Monte Carlo Simulation is useful when there is a strong and complex correlation between the parameters of a device. This is the case in IC manufacturing because the devices are manufactured simultaneously but at system level, since all the components are manufactured separately, Monte Carlo simulation is not very useful [7]. The objective of using statistical methods in this paper is to analyze at system level.…”

Section: Statistical Analysis a Model Usedmentioning

confidence: 99%

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Cost-effective optimization of serial link system for Signal Integrity and Power Integrity

Nagpal

Tripathi

Malik

2011

2011 12th International Symposium on Quality Electronic Design

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Section: Discussionmentioning

confidence: 99%

Section: Statistical Analysis a Model Usedmentioning

confidence: 99%

Cost-effective optimization of serial link system for Signal Integrity and Power Integrity

Nagpal

Tripathi

Malik

2011

2011 12th International Symposium on Quality Electronic Design

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“…In this design, the impedance of transmission line is about 75Ω in an ideal state. But in reality, the impedance of transmission line is about 100Ω because it is affected by the dielectric of PCB and internal resistance of driving end and load end [10]. Figure 7 shows the diagram of remote RC termination.…”

Section: Remote End Termination Resistor and Capacitor (Rc)mentioning

confidence: 99%

Analysis of Signal Integrity for High Precision Digital-to-Analog Conversion Circuit

Dai¹,

Wang²

2016

IJFGCN

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“…The impact of variability on board level signal integrity using TDR measurements, field solvers and RLGC transmission line models in HSPICE has been addressed [9]. In another work [10], a commercial field simulator and linear regression tool have been used to perform statistical analysis of filters on LCP substrates.…”

Section: Introductionmentioning

confidence: 99%

Statistical analysis of RF circuits using combined circuit simulator-full wave field solver approach

Sathanur

Chakraborty

Jandhyala

2007

2007 IEEE/ACM International Conference on Computer-Aided Design

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As technologies continue to shrink in size, modeling the effect of process variations on circuit performance is assuming profound significance. Process variations affect the onchip performance of both active and passive components. This necessitates the inclusion of the effect of these variations on distributed interconnect structures in modeling overall circuit performance. In this work, first it is shown through field-solver simulations that larger process variations lead to non-Gaussian PDFs (Probability Density Functions) for the circuit equivalent parameters of distributed passives. Next, a method for accurate statistical analysis of coupled circuit-EM (Electromagnetic) systems without computing the equivalent circuit parameters of EMmodeled objects is demonstrated. This method also obviates the need to generate random variables representing the equivalent circuit parameters, from distributions which are correlated, nonGaussian and non-closed-form. The proposed approach relies on application of the Response Surface (RS) methodology to the y-parameters of both the circuit and the distributed structures independently and expressing the eventual performance measures through a suitable combination of the y-parameters. The eventual performance measures are expressed through a hierarchical approach in terms of the underlying Gaussian random variables representing the process parameters. A rapid Response Surface Monte Carlo (RSMC) analysis on these derived response surfaces furnishes the PDFs and can also be used to predict the yield based on different qualifying criteria and objective functions.

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Statistical Signal Integrity Analysis and Diagnosis Methodology for High-Speed Systems

Cited by 65 publications

References 15 publications

Cost-effective optimization of serial link system for Signal Integrity and Power Integrity

Cost-effective optimization of serial link system for Signal Integrity and Power Integrity

Analysis of Signal Integrity for High Precision Digital-to-Analog Conversion Circuit

Statistical analysis of RF circuits using combined circuit simulator-full wave field solver approach

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