Statistical study of the radiation losses due to surface roughness for a dilectric slab deposited on a metal substrate

Afifi, Saddek; Dusséaux, Richard

doi:10.1016/j.optcom.2008.06.008

Cited by 8 publications

(6 citation statements)

References 27 publications

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“…(3) The calculations do not account for surface roughness at interfaces in the waveguide structure. Surface roughness causes scattering, which can broaden the spectral bands and attenuate sensitivity 34,35. AFM was performed on the waveguides used here to assess surface morphology.…”

Section: Resultsmentioning

confidence: 99%

Broadband Plasmon Waveguide Resonance Spectroscopy for Probing Biological Thin Films

et al. 2009

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A commercially available spectrometer has been modified to perform plasmon waveguide resonance (PWR) spectroscopy over a broad spectral bandwidth. When compared to surface plasmon resonance (SPR), PWR has the advantage of allowing measurements in both s-and ppolarizations on a waveguide surface that is silica or glass rather than a noble metal. Here the waveguide is a BK7 glass slide coated with silver and silica layers. The resonance wavelength is sensitive to the optical thickness of the medium adjacent to the silica layer. The sensitivity of this technique is characterized and compared with broadband SPR both experimentally and theoretically. The sensitivity of spectral PWR is comparable to that of spectral SPR for samples with refractive indices close to that of water. The hydrophilic surface of the waveguide allows supported lipid bilayers to be formed spontaneously by vesicle fusion; in contrast, the surface of an SPR chip requires chemical modification to create a supported lipid membrane. Broadband PWR spectroscopy should be a useful technique to study biointerfaces, including ligand binding to transmembrane receptors and adsorption of peripheral proteins on ligand-bearing membranes.

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Section: Resultsmentioning

confidence: 99%

Broadband Plasmon Waveguide Resonance Spectroscopy for Probing Biological Thin Films

et al. 2009

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“…Relation (38) indicates that these variables are correlated whether both interfaces are correlated or not. Substituting Equations (36)(37)(38)(39)(40)(41) into Equation (32) leads to…”

Section: 2mentioning

confidence: 99%

“…The incoherent intensity depends on the length L [36][37][38] and on the autocorrelation and intercorrelation functions. Since K…”

Section: 2mentioning

confidence: 99%

“…The majority of works focuses on the determination of coherent and incoherent intensities. However, there are several applications where knowledge of the amplitude and phase statistical distributions of the scattered field is necessary [34][35][36][37][38][39][40]. It is thus important to define these statistical distributions either from an analytical approach or Monte Carlo simulations.…”

Section: Introductionmentioning

confidence: 99%

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Statistical distribution of the field scattered by rough layered interfaces: formulae derived from the small perturbation method

Afifi¹,

Dusséaux²,

Oliveira³

2010

Waves in Random and Complex Media

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International audienceWe present a statistical study of electromagnetic wave scattering by a stack of two random rough interfaces that are characterised by Gaussian distributed heights and by exponential correlation functions. These interfaces can be correlated or not. The coherent and incoherent intensities and the statistical distribution of the scattered field in modulus and phase are obtained using the Rayleigh expansion and the small perturbation method. For a structure of finite extension, we show that the modulus follows a Hoyt law and the phase is not uniform. For a structure of infinite extension, whether the interfaces are correlated or not, the modulus of the field follows a Rayleigh law while the phase is uniform

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“…Nevertheless, there are various applications where the amplitude and phase statistical distributions of the field scattered from rough surfaces are required [6], i.e. optics [7][8][9][10][11][12][13][14][15], signal propagation and scattering for wireless communication [16][17][18][19][20] or remote sensing [21][22][23][24][25].…”

Section: Introductionmentioning

confidence: 99%

Analytical derivation of the stationarity and the ergodicity of a field scattered by a slightly rough random surface

Oliveira

Dusséaux

Afifi

2010

Waves in Random and Complex Media

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International audienceIn the framework of the small perturbation method, we present a new theoretical derivation of the statistical and spatial properties of a field scattered by a one-dimensional slightly rough random surface. The work concerns the intermediate field zone where the scattered field is reduced to the contribution of the progressive plane waves. The surface is assumed to be stationary, ergodic and Gaussian. First, from a statistical point of view, we demonstrate that under oblique incidence the scattered field is not stationary while it is strictly stationary under normal incidence. For an infinite surface, the scattered field modulus obeys to Hoyt law and the phase is not uniform. Second, from a spatial point of view, for a given altitude and under all incidences, we show that the scattered field is ergodic. Under oblique incidence, the phase is spatially uniform and the modulus is given by a Rayleigh law. Under normal incidence, the phase is not uniform and the modulus is given by a Hoyt law. Third, from a practical point of view, we show that the field measured by a directional antenna is ergodic and stationary if the angular transfer function of the antenna does not contain the specular direction

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Statistical study of the radiation losses due to surface roughness for a dilectric slab deposited on a metal substrate

Cited by 8 publications

References 27 publications

Broadband Plasmon Waveguide Resonance Spectroscopy for Probing Biological Thin Films

Broadband Plasmon Waveguide Resonance Spectroscopy for Probing Biological Thin Films

Statistical distribution of the field scattered by rough layered interfaces: formulae derived from the small perturbation method

Analytical derivation of the stationarity and the ergodicity of a field scattered by a slightly rough random surface

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