Status and review of advanced mixed-mode bending fracture test (AMB)

Schulz, Marcus; Keller, J.; Clemence, Vernier; Dressler, M.; Wunderle, Bernhard

doi:10.1109/estc.2018.8546410

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Cited by 5 publications

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“…testing approach [39] weighted random testing approach [40,41], mixed-mode testing approach [31][32][33] etc. Later on, different variants of mixed-mode testing approaches are proposed [34,35].…”

Section: Plos Onementioning

confidence: 99%

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Section: Plos Onementioning

confidence: 99%

“…BIST is a mode of operation of a chip other than its normal mode, where when a chip is switched to this mode, it performs its test by itself. Nowadays mixed-mode testing approach [31][32][33][34][35] is the state of the art technique for BIST implementation where the ASIC is tested using both pseudo-random test patterns for easy to test faults and deterministic test patterns for hard to detect faults, and thereby, maximum fault coverage is achieved. In this research, the mixed-mode BIST technique has been incorporated into the design of the AES cryptoprocessor ASIC.…”

Section: Introductionmentioning

confidence: 99%