2009
DOI: 10.1615/multscientechn.v21.i3.30
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Steady Microstructure of a Contact Line for a Liquid on a Heated Surface Overlaid With Its Pure Vapor: Parametric Study for a Classical Model

Abstract: Abstract. Based on a standard one-sided lubrication-type model, an analysis is carried out pertaining to a small vicinity of a contact line of a volatile non-polar perfectly-wetting macroscopic liquid sample surrounded with its pure vapour and attached to a smooth uniformly superheated solid surface. The behaviour of the liquid film is governed by the effects of evaporation, capillarity and the disjoining pressure. The kinetic resistance to evaporation, as well as the dependence of the local saturation tempera… Show more

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Cited by 18 publications
(47 citation statements)
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“…To establish when this happens, it is just sufficient to linearize eq 31 near ξ = 1 and calculate the eigenvalues. 7 Finally, it is interesting to note that the behavior given by eq 33 is valid not only in a volatileliquid case as considered here, but also in the case of a non-volatile liquid, recovered non-singularly within eq 33 by letting E = 0 (in fact, not enough terms are written down in the series of eq 33 to appreciate the difference between E = 0 and E = 0). In this connection, as far as the nonvolatile case is concerned, let us point out that the family of solutions with truncated precursor films for a moving contact line obtained by Hervet and de Gennes 16 must satisfy eq 33 (with E = 0 and rescaled to their notations).…”
Section: Traveling Microfilm Frontsmentioning
confidence: 81%
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“…To establish when this happens, it is just sufficient to linearize eq 31 near ξ = 1 and calculate the eigenvalues. 7 Finally, it is interesting to note that the behavior given by eq 33 is valid not only in a volatileliquid case as considered here, but also in the case of a non-volatile liquid, recovered non-singularly within eq 33 by letting E = 0 (in fact, not enough terms are written down in the series of eq 33 to appreciate the difference between E = 0 and E = 0). In this connection, as far as the nonvolatile case is concerned, let us point out that the family of solutions with truncated precursor films for a moving contact line obtained by Hervet and de Gennes 16 must satisfy eq 33 (with E = 0 and rescaled to their notations).…”
Section: Traveling Microfilm Frontsmentioning
confidence: 81%
“…Up to notations and scaling factors, and excluding additional physical effects sometimes incorporated into the model, eq 17 with eq 18 is of course the same as elsewhere, 5,6,8 while for a more detailed presentation in the same terms as here see an earlier work of the present authors. 7 However, it is worthwhile emphasizing the key features of the classical model used here such as its one-sidedness (in particular, the vapor pressure inhomogeneity is considered to be negligible, 15 and so is heat conduction into the vapor) and the constancy of the wall temperature (on the scales considered here). 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 l (which actually tends to be rather large in practice 7 ), one uses a steady version of eqs 17 and 18:…”
Section: Evolution Equation For the Film Thicknessmentioning
confidence: 99%
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“…It is the opposite in the case of Q d , and therefore, the contact angle can be pulled to its maximum value. Moreover, as Q i is measured in an evaporative state, while Q d is measured in an equilibrium state, one cannot exclude either an effect of apparent contact angle increase by evaporation 28 .…”
Section: Influence Of the Monolayer On The Evaporation Ratementioning
confidence: 99%