2022
DOI: 10.3390/nano12030337
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STEM Tools for Semiconductor Characterization: Beyond High-Resolution Imaging

Abstract: The smart engineering of novel semiconductor devices relies on the development of optimized functional materials suitable for the design of improved systems with advanced capabilities aside from better efficiencies. Thereby, the characterization of those materials at the highest level attainable is crucial for leading a proper understanding of their working principle. Due to the striking effect of atomic features on the behavior of semiconductor quantum- and nanostructures, scanning transmission electron micro… Show more

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Cited by 10 publications
(7 citation statements)
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References 98 publications
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“…On the other hand, in 1C and 4a_ZnO NCs the coating it is take place in deferment mode; the zinc is homogenously distributed through whole organic matrix. The complementary information were provided by use of the bright field (BF) detector which allow for atomic detection of light and heavy elements) 57 , 58 . In this type of analysis, the opposite visualization is possible—Fig.…”
Section: Resultsmentioning
confidence: 99%
“…On the other hand, in 1C and 4a_ZnO NCs the coating it is take place in deferment mode; the zinc is homogenously distributed through whole organic matrix. The complementary information were provided by use of the bright field (BF) detector which allow for atomic detection of light and heavy elements) 57 , 58 . In this type of analysis, the opposite visualization is possible—Fig.…”
Section: Resultsmentioning
confidence: 99%
“…[54,55] Scanning transmission electron microscopy (STEM), i.e., a system that rasters an electron beam across a sample, produces high resolution bright and dark contrast images with the use of bright field and dark field annular detectors. [56] High-resolution (HR)-TEM and Fourier transform (FT) of electron micrographs provide more information about the real space and, hence, allow the study of the crystallographic orientation of QDs in superlattices. [57,58] Nevertheless, these techniques have some limitations in characterizing self-assembled nanocrystals, as, e.g., TEM can resolve the crystallite orientation only up to a certain layer thickness (roughly 100 nm).…”
Section: Electron Microscopy and X-ray-based Techniquesmentioning
confidence: 99%
“…On the other hand, in 1C and 4a_ZnO NPs the coating it is take place in deferment mode; the zinc is homogenously distributed through whole organic matrix. The complementary information were provided by use of the bright eld (BF) detector which allow for atomic detection of light and heavy elements) 57,58 . In this type of analysis, the opposite visualization is possible -Fig.…”
Section: Electron Microscopymentioning
confidence: 99%