2018
DOI: 10.1016/j.cpc.2018.03.010
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Stochastic analysis of surface roughness models in quantum wires

Abstract: We present a signed particle computational approach for the Wigner transport model and use it to analyze the electron state dynamics in quantum wires focusing on the effect of surface roughness. Usually surface roughness is considered as a scattering model, accounted for by the Fermi Golden Rule, which relies on approximations like statistical averaging and in the case of quantum wires incorporates quantum corrections based on the mode space approach. We provide a novel computational approach to enable physica… Show more

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Cited by 9 publications
(8 citation statements)
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“…In the first step, we use the coupled 3D Poisson–2D Schrödinger solver in GARAND to evaluate the electric potential and field distributions at the cross section area of a gated (long channel) NWT, and to calculate the electron densities and the details of the electronic subbands (eigenfunctions and eigenvalues) in the NWT cross section normal to the transport direction. In the second step, we utilize the potential distribution, and the corresponding eigenfunctions (and relevant subband details) to calculate the 1D transition rates for the dominant scattering mechanisms in silicon, including the modified acoustic phonon, optical phonon, ionized impurity [18] and surface roughness scattering [20]. In the final step, we use the set of multi-subband scattering mechanism rates to calculate the scattering-limited mobilities of interesting NWT structures, by adopting the KG formalism solving for the (semi-classical) BTE within the relaxation time approximation [10,11].…”
Section: Simulation Methods and Physicsmentioning
confidence: 99%
See 1 more Smart Citation
“…In the first step, we use the coupled 3D Poisson–2D Schrödinger solver in GARAND to evaluate the electric potential and field distributions at the cross section area of a gated (long channel) NWT, and to calculate the electron densities and the details of the electronic subbands (eigenfunctions and eigenvalues) in the NWT cross section normal to the transport direction. In the second step, we utilize the potential distribution, and the corresponding eigenfunctions (and relevant subband details) to calculate the 1D transition rates for the dominant scattering mechanisms in silicon, including the modified acoustic phonon, optical phonon, ionized impurity [18] and surface roughness scattering [20]. In the final step, we use the set of multi-subband scattering mechanism rates to calculate the scattering-limited mobilities of interesting NWT structures, by adopting the KG formalism solving for the (semi-classical) BTE within the relaxation time approximation [10,11].…”
Section: Simulation Methods and Physicsmentioning
confidence: 99%
“…Surface roughness scattering is most pronounced when confinement keeps electrons close to non-ideal interfaces. The extent of the interaction with surface imperfections is dependent on the force normal to the interface, and the statistical description of the interface roughness [20]. Assuming x is the direction of transport along the nanowire, the perturbation Hamiltonian can be written as:H=eEy(s,x)Δy(x)+eEz(s,x)Δz(x), where Δ(y) and Δ(z) are the corresponding deviations of the silicon nanowire surface from the ideal surface, and boldEy and boldEz are the electric field components in the cross section normal to the direction of transport.…”
Section: Simulation Methods and Physicsmentioning
confidence: 99%
“…For surface roughness scattering, we assume that the root mean square (RMS) roughness and correlation length are 0.48 and 1.3nm, respectively. The assumptions of the SR scattering model have been recently verified in [14]. A constant effective ionized impurity concentration n0 = 10 18 cm -3 has been considered.…”
Section: B Low-field Mobility Calculationmentioning
confidence: 99%
“…We have to wait until the beginning of 2000, to have particle Monte Carlo (MC) solvers for the Wigner equation [21,15]. From that period up to now, several papers have been published on this subject (see [23] for a review) and, recently, very interesting device simulations have been provided [3,14,17].…”
Section: Introductionmentioning
confidence: 99%