2013
DOI: 10.1155/2013/547271
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Stoichiometry Control of ZnO Thin Film by Adjusting Working Gas Ratio during Radio Frequency Magnetron Sputtering

Abstract: ZnO thin films were deposited on quartz glasses by a radio frequency (rf) magnetron sputtering. The mechanism for stoichiometry in the ZnO thin films was investigated by adjusting Ar/O2 working gas ratio during deposition. The optical emission spectroscopy (OES) in situ measurement revealed the kinetics species variation during rf plasma deposition process. It was found that the intensity of the excited atomic oxygen (O*) was increased with the oxygen ratio increasing, resulting in enhancing the oxidization ef… Show more

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Cited by 10 publications
(5 citation statements)
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“…Therefore, oxidized, and non-oxidized sample we observe an increase in the mobility from 7.90 cm 2 /Vs to 39.0 cm 2 /Vs. However, the increase in resistivity from unoxidized ZnO and Oxidized ZnO happened due to decrease in oxygen vacancies present in the film, since the main conduction mechanism in ZnO thin films was due to oxygen vacancies [11], [13][14][15][16][17]. This is explained confirmed from the results where the number of charge carrier decreases when the ZnO thin film is oxidized.…”
Section: Fig 1 Optical Micrograph Of Azo Thin Filmmentioning
confidence: 55%
See 1 more Smart Citation
“…Therefore, oxidized, and non-oxidized sample we observe an increase in the mobility from 7.90 cm 2 /Vs to 39.0 cm 2 /Vs. However, the increase in resistivity from unoxidized ZnO and Oxidized ZnO happened due to decrease in oxygen vacancies present in the film, since the main conduction mechanism in ZnO thin films was due to oxygen vacancies [11], [13][14][15][16][17]. This is explained confirmed from the results where the number of charge carrier decreases when the ZnO thin film is oxidized.…”
Section: Fig 1 Optical Micrograph Of Azo Thin Filmmentioning
confidence: 55%
“…The table gives ZnO thin film deposition parameters implemented in this study. The films prepared by rf sputtering were sub stoichiometric [11], therefore, one sample was oxidized to compare the properties. Hence, the film it was annealed at 150 °C for 1 hour and then at 250 °C for 1 hour both in air atmosphere.…”
Section: Methodsmentioning
confidence: 99%
“…34 Therefore, we are likely to manage the stoichiometry of the ZnO film basically by modifying the ambient working gas in RF plasma deposition. 35 3.3. X-ray Diffraction (XRD) Analysis.…”
Section: Resultsmentioning
confidence: 99%
“…It is significant to mention that an alteration of RF plasma power can change the ionization of ambient argon gases, the kinetic energy of bombarding ions, kinetic energy of atoms, reactive species, and the substrate temperature . Therefore, we are likely to manage the stoichiometry of the ZnO film basically by modifying the ambient working gas in RF plasma deposition …”
Section: Resultsmentioning
confidence: 99%
“…The sputter rate goes down as the oxygen content increases from 3% to 50%. Indeed, having less argon in the process atmosphere, which acts as the main sputter gas, generally leads to lower sputter rates [21,22]. However, high oxygen content is generally needed to avoid oxygen substoichiometry [23].…”
Section: Resultsmentioning
confidence: 99%