Strain gages for long-term high-temperature strain measurement

Sharpe, W. N.

doi:10.1007/bf02318364

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1976

1990

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Cited by 17 publications

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“…The main difficulty with thermal stress measurements is that the reliability of the gage is questionable because of change in gage characteristics with temperature. Therefore, as the basic research for the measurements of thermal stresses, the various problems such as the changes in gage characteristics with temperature and the improvement of the measurement have been investigated by many researchers [1][2][3][4][5][6]. While in recent years the new configurational gages that can be used up to 700 0 C or 1000 0 C have been developed [7][8][9][10], it appears that a very accurate and simple measurement of thermal stresses has not been achieved.…”

Section: Introductionmentioning

confidence: 99%