1989
DOI: 10.1109/33.49020
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Strain-gauge mapping of die surface stresses

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Cited by 59 publications
(7 citation statements)
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“…Several studies have suggested that the edge of the die undergoes the most severe stress at increased temperatures. [5][6][7] Since the test vehicles have symmetrical geometry, the strain distribution is expected to be symmetrical with respect to the center of the die edge. Hence, synchrotron x-ray scans were conducted at the edge of the die to obtain sufficient information in the limited beam time.…”
Section: Measurement Of Real Strainmentioning
confidence: 99%
See 1 more Smart Citation
“…Several studies have suggested that the edge of the die undergoes the most severe stress at increased temperatures. [5][6][7] Since the test vehicles have symmetrical geometry, the strain distribution is expected to be symmetrical with respect to the center of the die edge. Hence, synchrotron x-ray scans were conducted at the edge of the die to obtain sufficient information in the limited beam time.…”
Section: Measurement Of Real Strainmentioning
confidence: 99%
“…1,2 The stresses in dies that are induced by different layers of materials, including the underfill, have also been discussed. 3,4 In 1989, Gee et al 5 used a strain gage to measure the stress on the surface of a chip undergoing thermal shock. The results indicated that the principal stress was highest at the center of the die and uniform over a large region.…”
Section: Introductionmentioning
confidence: 99%
“…In molding processes for instance, the different thermal expansion coefficients of the chip and the molding polymer account for a large part of the yield, stability, and reliability issues during IC packaging and operation. Therefore, stress sensor arrays have been used to map the stress distribution on the surface of the chip to characterize and improve the packaging process [74][75][76].…”
Section: Stress Monitoringmentioning
confidence: 99%
“…Distorted samples are then filtered out by using low-pass filtering. The nail sensor can suffer from changing bias, due to temperature change, from undesired induction in the circuit [26], or from battery aging. This bias can be removed estimating continuously the bias, and excluding it using Kalman filtering similar to [27].…”
Section: B Preprocessingmentioning
confidence: 99%