2021
DOI: 10.1016/j.nanoen.2021.106305
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Strain-induced piezotronic effects in nano-sized GaN thin films

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Cited by 16 publications
(9 citation statements)
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“…Thus, the piezotronics effect, where piezoelectric polarisation charges act as a "gating" voltage to tune transmission of electrons across the surface interface or connection junction. Further experimentation with logic gates and strain-gated piezotronic transistors led to the development of more observations and conclusions, giving more confirmation to this effect [36][37][38][39][40].…”
Section: Piezotronic Effectmentioning
confidence: 93%
“…Thus, the piezotronics effect, where piezoelectric polarisation charges act as a "gating" voltage to tune transmission of electrons across the surface interface or connection junction. Further experimentation with logic gates and strain-gated piezotronic transistors led to the development of more observations and conclusions, giving more confirmation to this effect [36][37][38][39][40].…”
Section: Piezotronic Effectmentioning
confidence: 93%
“…Figure e shows the strain-induced GaN thin film-based multifunctional sensors fabricated via the double-transfer method on a flexible polycarbonate substrate, where GaN thin films were exfoliated from the 2 in. GaN epitaxial wafer using the wafer-scale lift-off technique . Recently, many researchers have studied conceptually new multifunctional sensors based on the piezo-phototronic effect using a heterostructure such as InGaN/GaN (see Figure f) .…”
Section: Freestanding-membrane-based Electronicsmentioning
confidence: 99%
“…The key to fabricating strain‐gated piezotronic transistors is to find proper materials that integrate semiconductor and piezoelectric properties. Currently, 1D nanomaterials with strong tensile strain, such as ZnO, 179 GaN, 183 InN, 184 and doped PZT materials are potential candidates 178 . Among them, ZnO nanowires (NWs) material is one of the most popular material due to its mature preparation technology and high voltage properties (piezoelectric coefficient of 9.93 pm V −1 ).…”
Section: Structure‐optimized Fet For High‐quality Pressure‐dependent ...mentioning
confidence: 99%