2005
DOI: 10.1016/j.ijfatigue.2005.06.022
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Strain profiling of fatigue crack overload effects using energy dispersive X-ray diffraction

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Cited by 81 publications
(76 citation statements)
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“…Two different families of techniques have been used, namely, synchrotron X-ray diffraction and displacement field measurement either by Digital Image Correlation (DIC) or tracking of individual markers. Synchrotron X-ray diffraction studies allow mapping the crack tip strain field [4][5][6][7]. This method is mainly applied to unloaded samples and it focuses on measurement of the residual strains in the wake and at the tip of a post overload fatigue crack with a rather coarse spatial resolution along the crack front where the strain is averaged through the sample thickness for 1-mm thick samples where plane stress should prevail [7] or sampled every 300 µm to understand the stronger crack retardation observed near the specimen edges [5].…”
Section: Introductionmentioning
confidence: 99%
“…Two different families of techniques have been used, namely, synchrotron X-ray diffraction and displacement field measurement either by Digital Image Correlation (DIC) or tracking of individual markers. Synchrotron X-ray diffraction studies allow mapping the crack tip strain field [4][5][6][7]. This method is mainly applied to unloaded samples and it focuses on measurement of the residual strains in the wake and at the tip of a post overload fatigue crack with a rather coarse spatial resolution along the crack front where the strain is averaged through the sample thickness for 1-mm thick samples where plane stress should prevail [7] or sampled every 300 µm to understand the stronger crack retardation observed near the specimen edges [5].…”
Section: Introductionmentioning
confidence: 99%
“…The application of synchrotron based energy dispersive X-ray diffraction (EDXRD) to a measurement of local strain fields in the vicinity of fatigue cracks was discussed in a previous article by the authors [1][2]. The technique exploits the high intensity/energy white beam (30-200 KeV) x-rays of the X17 wiggler beamline at the Brookhaven National Synchrotron Light Source (NSLS).…”
Section: Technical Approachmentioning
confidence: 99%
“…The strain variation from position to position in the sample is then determined from the shifts in Bragg peak energy via the relation eh=(Ad/ do)hkl=(AE/ E 0 )hk 1 the a sample is translated through the beam. Here Ad = d-d 0 is the change in the lattice plane spacing, do is the lattice spacing of the stress-free materials, AE = E 0 -E is the corresponding Bragg peak shift and E 0 is the center of gravity of peak of the stress-free material [1][2]. A point far from the crack tip was chosen to determine the E 0 value.…”
Section: Technical Approachmentioning
confidence: 99%
“…In view of these considerations, blindhole-drilling [34], conventional X-ray [35] and neutron diffraction [36] appear to be not suitable, since they probe regions of millimetre dimensions, which are too large to resolve steep lateral RS gradients. Residual strain measurements with high lateral spatial resolution have been already done in the past using synchrotron XRD, mainly to determine crack-tip strain fields [37][38][39][40]. However, as high energy XRD utilizes small diffraction angles, the very high lateral spatial resolution can usually only be achieved in two orthogonal directions at the centre of bulk specimens.…”
Section: Introductionmentioning
confidence: 99%