Stress Analysis and Q‐Factor of Free‐Standing (La,Sr)MnO₃Oxide Resonators

Abstract

High‐sensitivity nanomechanical sensors are mostly based on silicon technology and related materials. The use of functional materials, such as complex oxides having strong interplay between structural, electronic, and magnetic properties, may open possibilities for developing new mechanical transduction schemes and for further enhancement of the device performances. The integration of these materials into micro/nano‐electro‐mechanical systems (MEMS/NEMS) is still at its very beginning and critical basic aspects related to the stress state and the quality factors of mechanical resonators made from epitaxial oxide thin films need to be investigated. Here, suspended micro‐bridges are realized from single‐crystal thin films of (La0.7,Sr0.3)MnO3 (LSMO), a prototypical complex oxide showing ferromagnetic ground state at room temperature. These devices are characterized in terms of resonance frequency, stress state, and Q‐factor. LSMO resonators are highly stressed, with a maximum value of ≈260 MPa. The temperature dependence of their mechanical resonance is discussed considering both thermal strain and the temperature‐dependent Young's modulus. The measured Q‐factors reach few tens of thousands at room temperature, with indications of further improvements by optimizing the fabrication protocols. These results demonstrate that complex oxides are suitable to realize high Q‐factor mechanical resonators, paving the way toward the development of full‐oxide MEMS/NEMS sensors.

Interfacial strain induced giant magnetoresistance and magnetodielectric effects in multiferroic BCZT/LSMO thin film heterostructures

“…From the slope of the curves, a qualitative assessment of the residual stress within BCZT and LSMO layers has been determined. The values of Y for bulk BCZT and LSMO have been considered as 117.9 GPa 60 and 127 GPa, 61 respectively; and ν values for bulk BCZT and LSMO are 0.21 62 and 0.26, 63 respectively. The residual stress values calculated for the BCZT and LSMO layers are listed in Table I.…”