Stress shielding at the bone‐implant interface: Influence of surface roughness and of the bone‐implant contact ratio

Abstract

Short and long‐term stabilities of cementless implants are strongly determined by the interfacial load transfer between implants and bone tissue. Stress‐shielding effects arise from shear stresses due to the difference of material properties between bone and the implant. It remains difficult to measure the stress field in periprosthetic bone tissue. This study proposes to investigate the dependence of the stress field in periprosthetic bone tissue on (i) the implant surface roughness, (ii) the material properties of bone and of the implant, (iii) the bone‐implant contact ratio. To do so, a microscale two‐dimensional finite element model of an osseointegrated bone‐implant interface was developed where the surface roughness was modeled by a sinusoidal surface. The results show that the isostatic pressure is not affected by the presence of the bone‐implant interface while shear stresses arise due to the combined effects of a geometrical singularity (for low surface roughness) and of shear stresses at the bone‐implant interface (for high surface roughness). Stress‐shielding effects are likely to be more important when the bone‐implant contact ratio value is low, which corresponds to a case of relatively low implant stability. Shear stress reach a maximum value at a distance from the interface comprised between 0 and 0.1 time roughness wavelength λ and tend to 0 at a distance from the implant surface higher than λ, independently from bone‐implant contact ratio and waviness ratio. A comparison with an analytical model allows validating the numerical results. Future work should use the present approach to model osseointegration phenomena.

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