Stress, texture and microstructure of zirconium thin films probed by X-ray diffraction

Chakraborty, Jay; Kumar, K. Kishor; Mukherjee, S. K.; Ray, S. K.

doi:10.1016/j.tsf.2008.04.096

Cited by 24 publications

(16 citation statements)

References 36 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The diffraction peaks are wide, which is associated with a small crystallite size (grain fineness), and large microstrain due to the presence of structural defects. An anisotropic shape is observed that can be caused by stress, this also indicates that the crystallites have an anisotropy shape [18].…”

Section: Xrd Analysismentioning

confidence: 78%

Study of the interaction between a zirconium thin film and an EN C100 steel substrate: Temperature effect

Benouareth

Tristant

Jaoul

et al. 2016

Vacuum

View full text Add to dashboard Cite

HAL is a multi-disciplinary open access archive for the deposit and dissemination of scientific research documents, whether they are published or not. The documents may come from teaching and research institutions in France or abroad, or from public or private research centers. AbstractZirconium thin films were grown on high carbon steel substrates EN C100 (1 %wt. of carbon) by RF magnetron sputtering. In order to study the reactivity of the film/substrate system as a function of the temperature, one hour vacuum annealing was carried out for different temperatures between 600°C and 1100°C. The films were then analyzed by X-ray diffraction, scanning electron microscopy, glow discharge optical emission spectroscopy (GDOES) and nanoindentation.The obtained results showed a progressive transformation of zirconium film to zirconium carbide.Carbon atoms diffusion from substrate toward the film induced this transformation. The sample annealed at 900°C exhibited the best mechanicals properties (H =17 GPa and E = 220 GPa).Samples treated at higher temperature were affected by oxidation and high microporosity. Even if the conversion is uncomplete, annealing significantly promotes adhesion of the film on the substrate.

show abstract

Section: Xrd Analysismentioning

confidence: 78%

Study of the interaction between a zirconium thin film and an EN C100 steel substrate: Temperature effect

Benouareth

Tristant

Jaoul

et al. 2016

Vacuum

View full text Add to dashboard Cite

show abstract

“…It is known that thin films can withstand very large amount of stresses (~ a few GPa). Fig.2 (b) & (c) show thickness dependent stresses in Zr and Ti thin films respectively [8,4]. Ti thin films undergoes hcp to fcc phase transformation (as film deposition time decreases) and the stress values in both the phases are shown in Fig.…”

Section: Thickness Dependence: Polycrystalline Thin Filmsmentioning

confidence: 97%

“…Fig. 1(a) shows the change of crystallite size with film thickness reduction in Zr thin films [8]. Film thickness/crystallite size reduction further leads to change in the ratios of 'strain free' lattice parameters (c o /a o ) of Zr thin films [ Fig.…”

Section: Thickness Dependence: Polycrystalline Thin Filmsmentioning

confidence: 99%

“…In the last section of the paper, stability of hcp Ti phase in polycrystalline Ti thin films has been considered from a thermodynamic point of view. Figure 1: (a) Change of crystallite size with film thickness in Zr thin films [8]; (b) Change of strain free lattice parameters ratios (c o /a o ) in Zr thin films with film thickness [8]; (c) Lattice expansion in Nb thin films with decreasing crystallite size [9]; (d) Lattice expansion of hcp titanium in Ti thin films with decreasing deposition time (or film thickness) [4].…”

Section: Thickness Dependence: Polycrystalline Thin Filmsmentioning

confidence: 99%

“…(a) (b) (c) Figure 2: (a) Crystallographic texture evolution in hcp and fcc Ti phases in Ti thin films [4]; (b) Variation of intrinsic stress with changing film thickness in Zr thin films [8]; (c) Thickness dependent intrinsic stresses in hcp and fcc phases in Ti thin films [4]. Stress analysis has been done by measurement of orientation dependent inter-planar lattice spacing (d) of individual peak reflections for both Ti and Zr films.…”

Section: Thickness Dependence: Polycrystalline Thin Filmsmentioning

confidence: 99%

See 2 more Smart Citations