2014
DOI: 10.1051/epjconf/20147505013
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Stresses evolution at high temperature (200°C) on the interface of thin films in magnetic components

Abstract: Abstract.In the field of electronics, the increase of operating temperatures is a major industrial and scientific challenge because it allows reducing mass and volume of components especially in the aeronautic domain. So minimizing our components reduce masses and the use of cooling systems. For that, the behaviours and interface stresses of our components (in particular magnetic inductors and transformers) that are constituted of one magnetic layer (YIG) or an alumina substrate (Al 2 O 3 ) representing the su… Show more

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Cited by 4 publications
(3 citation statements)
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“…Hence, expression ( 9) can be extended to the temperature dependence of the resistance R of a component by using the well-known formula R = ρL/S, where L is the conductor length and S its section. According to (9), it is possible to measure the temperature change of a resistive component by measuring its resistance at two different temperatures if its thermal coefficient is known:…”
Section: A Theory and Measurement Principlementioning
confidence: 99%
See 1 more Smart Citation
“…Hence, expression ( 9) can be extended to the temperature dependence of the resistance R of a component by using the well-known formula R = ρL/S, where L is the conductor length and S its section. According to (9), it is possible to measure the temperature change of a resistive component by measuring its resistance at two different temperatures if its thermal coefficient is known:…”
Section: A Theory and Measurement Principlementioning
confidence: 99%
“…Secondly, as electronic components are constituted of several materials, the difference in thermal expansion between materials can induce strain inside the component. In some cases, cracks can appear, and layers can lift away leading to the component destruction [9]. Then, it is important to estimate real temperature reached inside an electronic component during operation to ensure viability of circuit [10].…”
Section: Introductionmentioning
confidence: 99%
“…Secondly, as electronic components are constituted of several materials, the difference in thermal expansion between materials can induce strain inside components. In some cases, cracks can appear, and layers can lift away leading to the component destruction 9 . Then, it is important to estimate real temperature reached inside an electronic component during operation to ensure viability of circuit 10 .…”
Section: Introductionmentioning
confidence: 99%