2001
DOI: 10.1149/1.1353570
|View full text |Cite
|
Sign up to set email alerts
|

Structural Analysis of Submicrometer LiCoO[sub 2] Films

Abstract: Submicrometer LiCoO 2 films were prepared with pulsed laser deposition ͑PLD͒ and rf sputtering using stoichiometric targets. The influences of both substrate material and annealing procedure on the polycrystalline microstructure of the LiCoO 2 films were investigated. XRD analysis revealed strong preferential orientation: annealed films deposited with PLD had their ͑00l͒ planes parallel to the surface, while rf sputtered films had their ͑110͒ planes in this orientation. The rf-film also developed the ͑003͒ ref… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
46
1

Year Published

2007
2007
2023
2023

Publication Types

Select...
6
2

Relationship

1
7

Authors

Journals

citations
Cited by 62 publications
(47 citation statements)
references
References 12 publications
0
46
1
Order By: Relevance
“…As before, a clear enrichment of Li is detected close to the surface. But in the case of the glass here, the enrichment of Li is balanced by a joint decrease of the second metal and oxygen as well, in obvious contrast to the previous case of LiCoO 2 in which the increase of Li was accompanied by an increase of the oxygen content. Furthermore, the elevated Li content at the surface is counterbalanced by an obvious loss of Li at the opposite side of the glass layer towards the tungsten substrate, as marked by light and dark shaded areas in Fig.…”
Section: Atom Probe Tomographycontrasting
confidence: 80%
See 1 more Smart Citation
“…As before, a clear enrichment of Li is detected close to the surface. But in the case of the glass here, the enrichment of Li is balanced by a joint decrease of the second metal and oxygen as well, in obvious contrast to the previous case of LiCoO 2 in which the increase of Li was accompanied by an increase of the oxygen content. Furthermore, the elevated Li content at the surface is counterbalanced by an obvious loss of Li at the opposite side of the glass layer towards the tungsten substrate, as marked by light and dark shaded areas in Fig.…”
Section: Atom Probe Tomographycontrasting
confidence: 80%
“…Therefore, the growth of thin films has attracted considerable attention recently, see e.g. [1][2][3][4][5].…”
Section: Introductionmentioning
confidence: 99%
“…However, the formation of HT-LiCoO 2 has also been reported by the application of relatively low temperature wet-chemical processes. [ 25 ] The same two polymorphs of LiCoO 2 are also observed when depositing solid-state thinfi lms which can, amongst other methods, be achieved by RF sputtering, [26][27][28][29] sol-gel deposition, [ 27 , 30-32 ] chemical vapor deposition [ 33 , 34 ] and pulsed laser deposition. [ 29 ] HT-LiCoO 2 is well-known for its layered hexagonal structure.…”
Section: All-solid-state Microbatteriesmentioning
confidence: 98%
“…In this work, HT-LiCoO 2 was deposited on Pt-coated silicon by rf sputtering. Although the electrochemical properties and some fabrication parameters of rf-sputtered LiCoO 2 thin films have been investigated [3][4][5][6][7][8][9][10][11][12], the film growth of HT-LiCoO 2 under various sputtering parameters and the dependence of Li + diffusion coefficient (D Li + ) in rf-sputtered HT-LiCoO 2 films on various annealing temperatures were not yet reported. Thus, * Corresponding author.…”
Section: Introductionmentioning
confidence: 99%