2013
DOI: 10.1016/j.jcrysgro.2013.06.012
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Structural and compositional properties of CZTS thin films formed by rapid thermal annealing of electrodeposited layers

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Cited by 26 publications
(11 citation statements)
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“…The electrical contacts were made on thin film surface using adhesive silver conductive paint and the measurements were performed by gradually increasing the applied voltage up to 6 V. with the previous reports in the literature [9,27]. The crystallite sizes of the samples were estimated using the well-known Scherrer's equation [15,[29][30][31], based on the (2 1 2) crystalline peak of Cu3SbS3 phase:…”
Section: Methodsmentioning
confidence: 99%
“…The electrical contacts were made on thin film surface using adhesive silver conductive paint and the measurements were performed by gradually increasing the applied voltage up to 6 V. with the previous reports in the literature [9,27]. The crystallite sizes of the samples were estimated using the well-known Scherrer's equation [15,[29][30][31], based on the (2 1 2) crystalline peak of Cu3SbS3 phase:…”
Section: Methodsmentioning
confidence: 99%
“…Many methods have been tested to grow this compound but the best results, so far, have been obtained with hydrazine based precursor solutions [7] and coevaporation [8]. Recently, it has been reported the preparation of CZTS by rapid thermal annealing, identical to rapid thermal processing, of electrodeposited elemental precursors leading to films with good crystallinity [9,10]. In this work, the CZTS growth method consists in the sulphurization of precursor layers in a rapid thermal processing furnace.…”
Section: Introductionmentioning
confidence: 99%
“…These considerations indicate that the annealing process must be carried out in in a short time in order to avoid the formation of secondary phases. Literature surveys show that CZTSSe thin films annealed in a conventional furnace have more secondary phases due to a slow heating rate (the low melting point elements evaporate greatly and form charge carrier declining secondary phases) than those annealed in a rapid thermal annealing (RTA) system [15,16]. Since the RTA system has advantages like; easy suppression of Sn and Zn evapoaration, fast annealing time and application to industry, minimum energy and cost requirements, space, and lower toxicity, it is a very good option for annealing CZTSSe thin films [16] and therefore we used.…”
mentioning
confidence: 99%