Structural and Magnetic Properties of the Thin Film of Cobalt Nitride

Abstract

Cobalt nitride has been prepared and studied for magnetic memory applications. Sol–gel technique is used to prepare thin films of cobalt nitride. The films were deposited onto Cu substrates by spin coating at 3000 rpm for 30 s. The films were then air dried and heated at 300°C for 120 min. As-deposited and heated samples were characterized for their structural and magnetic properties using X-ray diffractometer (XRD) and vibrating sample magnetometer (VSM) techniques. The grain size was in the range of 22.7–30.10 nm. Their surface was studied by scanning electron microscopy (SEM). Orthorhombic structure can be seen in SEM micrographs. This orthorhombic structure is also confirmed by XRD.