2004
DOI: 10.1063/1.1728313
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Structural and optical properties of titanium dioxide films deposited by reactive magnetron sputtering in pure oxygen plasma

Abstract: Photoluminescence spectroscopy and energy-level analysis of metal-organic-deposited Ga2O3:Cr3+ films J. Appl. Phys. 112, 063522 (2012) Electrical and optical properties of vanadium dioxide containing gold nanoparticles deposited by pulsed laser deposition Appl. Phys. Lett. 101, 133102 (2012) Controlling spatial distribution of thermal poling induced second-order optical nonlinearity with multilayered structures Appl. Phys. Lett. 101, 101101 (2012) Optical characteristic of sol-gel synthesized lead lan… Show more

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Cited by 123 publications
(55 citation statements)
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“…The substrate absorbance was corrected by introducing an uncoated glass substrate. The optical band gap of the film determined using the Tauc's model [42]. …”
Section: Optical and Electrical Characterizationmentioning
confidence: 99%
“…The substrate absorbance was corrected by introducing an uncoated glass substrate. The optical band gap of the film determined using the Tauc's model [42]. …”
Section: Optical and Electrical Characterizationmentioning
confidence: 99%
“…TiO 2 thin films have been synthesized by using numerous methods including plasma oxidation [20], chemical vapor deposition (CVD) [21], metal organic chemical vapor deposition (MOCVD) [22], sputtering [23], atomic layer deposition (ALD) [24], plasmaenhanced ALD (PEALD) [25] and pulsed laser deposition (PLD) [26]. Among the above mentioned techniques, PLD provides thin films with good mechanical rigidity and with high specific surface area [27,28].…”
Section: Introductionmentioning
confidence: 99%
“…TiO 2 films deposited at room temperature (303 K) were of X-ray amorphous. The as-deposited films were annealed in air for 1 hour at 1023 K. During DC reactive magnetron sputtering, the particles generally impinge on the substrate with energy in the range of 1-10 eV [16], which accelerates the growth of sputtered TiO 2 films with anatase or rutile phase [17]. The films formed at low sputtering power of 80 W showed four weak diffraction peaks were obtained (101), (110), (004) and (200) …”
Section: Methodsmentioning
confidence: 99%