Structural characterization of CdTe thin films developed on metallic substrates by close spaced sublimation

Hernández, Germán Pérez; Mathew, Xavier; Pantoja, Joel; Morales, B. E.; Lira, M. Meléndez; Toledo, Julia; Juárez, A. Sánchez; Campos, J.

doi:10.1023/b:jmsc.0000013932.66354.a2

Cited by 35 publications

(14 citation statements)

References 8 publications

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“…The value of the texture coefficient P i (Eq. (9)) is an indicator of the preferential orientation of the crystallites along a crystal plane (hkl) [33]. If the P i value is unity the crystallites are considered to be randomly oriented whereas P i greater than unity indicates a preferred orientation for the crystallites in that particular direction.…”

Section: Structural and Morphological Studiesmentioning

confidence: 99%

Physical properties of pulse electrodeposited lead sulfide thin films

Mathews

Ángeles–Chávez

Cortés-Jácome

et al. 2013

Electrochimica Acta

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Section: Structural and Morphological Studiesmentioning

confidence: 99%

Physical properties of pulse electrodeposited lead sulfide thin films

Mathews

Ángeles–Chávez

Cortés-Jácome

et al. 2013

Electrochimica Acta

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“…The preferred orientation of the crystallites along a crystal plane (hkl) in a thin film can be described by the term called texture coefficient [23,24] …”

Section: Structural Studiesmentioning

confidence: 99%

Effect of annealing on structural, optical and electrical properties of pulse electrodeposited tin sulfide films

Mathews

Garcia

Torres

2013

Materials Science in Semiconductor Processing

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“…For fabrication of the CdTe films a variety of preparation techniques have been employed such as vacuum deposition [14][15][16], electro deposition [17], molecular beam epitaxy [18], metal-organic chemical vapor deposition [19], closed-space sublimation [20], and screen-printing [21]. The vacuum evaporation method has some advantages such as: the amount of impurities included in the growing layer will be minimized, the tendency to form oxides will be considerably reduced and finally straight line propagation will occur from the source to substrate.…”

Section: Introductionmentioning

confidence: 99%

Electronic structure, structural and optical properties of thermally evaporated CdTe thin films

Lalitha¹,

Karazhanov

Ravindran

et al. 2007

Physica B: Condensed Matter

125

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Thin films of CdTe were deposited on glass substrates by thermal evaporation. From the XRD measurements it is found that the films are of zinc-blende-type structure. The lattice parameter was determined as a = 6.529 Å, which is larger than 6.48 Å of the powder sample, because the recrystallized lattice of the grown films is subjected to a compressive stress aroused as a result of the lattice mismatch and/or differences in thermal expansion co-efficient between the CdTe and the underlying substrate. Transmittance, absorption, extinction, and refractive coefficients are measured. Electronic structure, band parameters and optical spectra of CdTe were calculated from ab initio studies within the LDA and LDA+U approximations. It is shown that LDA underestimates the band gap, energy levels of the Cd-4d states, s-d coupling and band dispersion. However, it calculates the spin-orbit coupling correctly. LDA+U did not increase much the band gap value, but it corrected the s-d coupling by shifting the Cd-4d levels towards the experimentally determined location and by splitting the LDA-derived single s peak into two peaks, which originates from admixture of s and d states. It is shown that the s-d coupling plays an important role in absorption and reflectivity constants. The calculated optical spectra fairly agree with experimental data. Independent of wave-vector scissors operator is found to be a good first approximation to shift rigidly the band gap of CdTe underestimated by LDA.

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Structural characterization of CdTe thin films developed on metallic substrates by close spaced sublimation

Cited by 35 publications

References 8 publications

Physical properties of pulse electrodeposited lead sulfide thin films

Physical properties of pulse electrodeposited lead sulfide thin films

Effect of annealing on structural, optical and electrical properties of pulse electrodeposited tin sulfide films

Electronic structure, structural and optical properties of thermally evaporated CdTe thin films

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