2015 Help me understand this report
Structural characterization of Cr/Gd/Cr and Cr/Gd/Fe/Cr multilayer nanostructures by X-ray reflectometry
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“…The measurements can be performed at synchrotron radiation facilities 1,2 as well as with benchtop instruments. 3,4 Due to the broad applications of XRR, several codes for the quantication of the measurements exist, with IMD 5,6 being the most popular. Though, as has been shown in ref.…”
Section: Introductionmentioning
confidence: 99%
“…The measurements can be performed at synchrotron radiation facilities 1,2 as well as with benchtop instruments. 3,4 Due to the broad applications of XRR, several codes for the quantication of the measurements exist, with IMD 5,6 being the most popular. Though, as has been shown in ref.…”
Section: Introductionmentioning
confidence: 99%
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