1998
DOI: 10.1016/s0257-8972(97)00589-6
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Structural characterization of multilayered sputtered TiN/ZrN coatings

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Cited by 25 publications
(13 citation statements)
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“…Error bars are given for the sake of clarity. The bilayer period was determined from structural re®nement of the XRD high angle patterns of the same ®lms [19]. Table 2 presents a summary of all of the experimental data extracted for a series of samples regarding the critical loads detected for the ®rst failure (L c1 ) and the total adhesion failure (L c2 ).…”
Section: Hardness and Young's Modulusmentioning
confidence: 99%
See 1 more Smart Citation
“…Error bars are given for the sake of clarity. The bilayer period was determined from structural re®nement of the XRD high angle patterns of the same ®lms [19]. Table 2 presents a summary of all of the experimental data extracted for a series of samples regarding the critical loads detected for the ®rst failure (L c1 ) and the total adhesion failure (L c2 ).…”
Section: Hardness and Young's Modulusmentioning
confidence: 99%
“…3 represents an example of a scratch test performed on the sample M10, grown by static mode. Visible are the plots of the AE signal, the transversal frictional force and Table 2 Critical load values obtained for the first failure (L c1 ) and total failure (L c2 ) corresponding to TiN/ZrN multi-layers, when subjected to a scratch test The modulation period (Á) is also shown [19]. An average number of 6 tests was performed on each sample.…”
Section: Hardness and Young's Modulusmentioning
confidence: 99%
“…Therefore, the scattering solely arises from the chemical modulation of the structure. The modulation period can be experimentally assessed through the position of the low-angle Bragg di!raction peaks [10,11]:…”
Section: Methodsmentioning
confidence: 99%
“…Vacuum-arc evaporation of cathode is a promising deposition method, which allows fabrication of multilayered coatings on the base of nitrides and carbides of transition metals [5][6][7][8]. A varying the deposition conditions, such as gas pressure in the deposition chamber, bias potential, bilayer thickness, etc.…”
Section: Introductionmentioning
confidence: 99%