2011
DOI: 10.1142/s0217984911025626
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STRUCTURAL, ELECTRICAL AND MAGNETIC CHARACTERIZATION OF NiCuZn SPINEL FERRITES

Abstract: Ni – Cu – Zn ferrite materials have been extensively used in multilayer chip inductors because of their remarkable properties at higher frequencies. In the present work, single phase Ni 0.35 Cu 0.05 Zn 0.60 Fe 1.98 O 4-δ ferrite, has been prepared by microwave sintered (MS) method. In comparison with the conventional sintering method (CS), the sintering temperature and time for this MS method were significantly reduced to 30 min and 950°C from 5 h and 1250°C for the CS process. The frequency dependence of the … Show more

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Cited by 6 publications
(3 citation statements)
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“…The reduction in tan loss made these thin films appropriate for a variety of high‐device applications, including electronic components, laptop computers, mobile telephones, and multilayered wafer inductors. [ 54 ]…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The reduction in tan loss made these thin films appropriate for a variety of high‐device applications, including electronic components, laptop computers, mobile telephones, and multilayered wafer inductors. [ 54 ]…”
Section: Resultsmentioning
confidence: 99%
“…[3] The reduction in tan loss made these thin films appropriate for a variety of high-device applications, including electronic components, laptop computers, mobile telephones, and multilayered wafer inductors. [54] The noticeable drop in dielectric constant and tangent loss with increasing frequency was due to the fact that at higher frequencies, the polarization lagged behind the applied field.…”
Section: Dielectric Propertiesmentioning
confidence: 99%
“…The dielectric tan loss was likewise reduced when Ba doping content was enhanced [88]. Due to the reduction of dielectric tan loss, thin films were appropriate for a variety of highfrequency purposes, including notebook computers [89], multilayer chip inductors [90], electrical devices and cellular phones. The applied frequency had the same effect on the dielectric constant and tangent loss [91].…”
mentioning
confidence: 99%