2016
DOI: 10.1016/j.tsf.2016.08.051
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Structural, electrical and optical properties of K-doped NiO films prepared by rapid pyrolysis sol-gel technique

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Cited by 24 publications
(16 citation statements)
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“…The surface morphologies of the Ni 1–2 x Cu x K x O ( x = 0.04, 0.05) films should be mainly related to the K doping concentration and can be explained according to a previous study . In the process of rapid pyrolysis, for the films with a higher K doping concentration, the pyrolysis gas would be more difficult to release from the coating layer and then would induce swelling of the coating layer.…”
Section: Resultsmentioning
confidence: 92%
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“…The surface morphologies of the Ni 1–2 x Cu x K x O ( x = 0.04, 0.05) films should be mainly related to the K doping concentration and can be explained according to a previous study . In the process of rapid pyrolysis, for the films with a higher K doping concentration, the pyrolysis gas would be more difficult to release from the coating layer and then would induce swelling of the coating layer.…”
Section: Resultsmentioning
confidence: 92%
“…In the study of Cu‐doped NiO films, there did not appear circular bulges or broken and cracked bulges, although the Cu doping concentration reached 10 atm% or even higher. However, there were some maze‐like bulges, and the bulges were even broken or cracked in the films with a higher K doping concentration . Therefore, the surface morphologies of the films with x = 0.04 and 0.05 should be mainly caused by the high doping concentration of K.…”
Section: Resultsmentioning
confidence: 99%
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