The research on two-dimensional
colloidal semiconductors has received
a boost from the emergence of ultrathin lead halide perovskite nanoplatelets.
While the optical properties of these materials have been widely investigated,
their accurate structural and compositional characterization is still
challenging. Here, we exploited the natural tendency of the platelets
to stack into highly ordered films, which can be treated as single
crystals made of alternating layers of organic ligands and inorganic
nanoplatelets, to investigate their structure by multilayer diffraction.
Using X-ray diffraction alone, this method allowed us to reveal the
structure of ∼12 Å thick Cs–Pb–Br perovskite
and ∼25 Å thick Cs–Pb–I–Cl Ruddlesden–Popper
nanoplatelets by precisely measuring their thickness, stoichiometry,
surface passivation type and coverage, as well as deviations from
the crystal structures of the corresponding bulk materials. It is
noteworthy that a single, readily available experimental technique,
coupled with proper modeling, provides access to such detailed structural
and compositional information.