The Pb content effect of chemical solution deposited lanthanum-doped lead zirconate titanate (PLZT) (Pb : La : Zr : Ti = Pb : 3 : 30 : 70, Pb = 105 * 117) was studied for conductive aluminum-doped zinc oxide (AZO) and tin-doped indium oxide (ITO) deposited as top electrodes by means of pulsed laser deposition. The crystallinity, surface morphology, ferroelectric properties and hydrogen degradation resistance of the ITO/PLZT/Pt and AZO/ PLZT/Pt capacitors were evaluated. All the PLZT films showed perovskite phase (revealed by X-ray diffraction patterns) and showed similar surface morphology and grain size (revealed by scanning electron microscopy images). PLZT capacitors with a Pb content of 113 exhibited the largest remnant polarization (at 15 V (300 kV cm -1 )), however, the difference in hydrogen degradation resistance was small between the four levels of Pb content.