Structural investigation of thin films of Ti1−xAlxN ternary nitrides using Ti K-edge X-ray absorption fine structure

Composition-dependent structure of polycrystalline magnetron-sputtered V–Al–C–N hard coatings studied by XRD, XPS, XANES and EXAFS

“…the peak height decreases with increasing Al content. Similar observations were reported by Tuilier et al (2007) for TiAlN. This similarity between the phase shifts of Ti and V is expected, since the elements are immediate neighbours in the periodic table.…”

“…and f.c.c. structures, as has been shown by Tuilier et al (2007) for hexagonal and cubic TiAlN. In our case, the measured distance is nearly identical to the distance expected for cubic VC, indicating that the V atoms are mainly incorporated into the f.c.c.…”

“…Typical experimental values are in the ranges 0.4-0.6 for c 1 and 0.6-0.8 for c 2 (Zhou et al, 1999;Tuilier et al, 2007;Holec et al, 2011). The value of c t for AlN in the metastable cubic mixed phase is around 0.7 (Mayrhofer et al, 2007;Holec et al, 2011).…”

Properties and phase transition of (Ti,Al)N thin films prepared by ion beam-assisted deposition

“…8 shows a GXRD spectrum measured for the Al-Ti-N sample before and after implantation and after annealing. The lattice parameter (a) of the fcc-Ti 1Àx Al x N was found to decrease almost linearly with increasing Al content, according to Vegard's law [4,28]. The fcc-Ti 1Àx Al x N network constants we have determined for the Ti-Al-N and Al-Ti-N samples are a ¼ 0.419 nm and a ¼ 0.417 nm, respectively.…”

“…In the Ti-N-Al sample it is present for an angle value of 37.09 AE 0.02 , whereas in the Al-Ti-N sample for 2Q ¼ 37.19 AE 0.02 . Assuming a linear position change and considering the results presented in papers [2,25,28,29], we can estimate the value x ¼ 0.4 for the Ti-Al-N sample and x ¼ 0.5 for the Al-Ti-N sample.…”