2022
DOI: 10.3390/coatings12060717
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Structural, Morphologic, and Ferroelectric Properties of PZT Films Deposited through Layer-by-Layer Reactive DC Magnetron Sputtering

Abstract: Lead zirconate titanate (PZT) is a widely used material with applications ranging from piezoelectric sensors to developing non-volatile memory devices. Pb(ZrxTi1−x)O3 films were deposited by DC reactive magnetron sputtering at a temperature range of (500–600) °C. X-ray diffraction (XRD) indicated the perovskite phase formation in samples synthesized at 550 °C, which agrees with Raman data analysis. Scanning electron microscopy (SEM) measurements supplemented XRD data and showed the formation of dense PZT micro… Show more

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Cited by 5 publications
(3 citation statements)
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“…PZT piezoelectric thin films are widely used, which can be made by various methods, such as magnetron sputtering (A strategy for obtaining AlN, 2023), chemical vapour deposition (Beklešovas et al, 2022), molecular beam epitaxial growth, hydrothermal synthesis (Aratani et al, 2001), pulsed laser deposition (Bian et al, 2016), and sol-gel (Gatabi et al, 2017).…”
Section: Pzt Piezoelectric Filmsmentioning
confidence: 99%
“…PZT piezoelectric thin films are widely used, which can be made by various methods, such as magnetron sputtering (A strategy for obtaining AlN, 2023), chemical vapour deposition (Beklešovas et al, 2022), molecular beam epitaxial growth, hydrothermal synthesis (Aratani et al, 2001), pulsed laser deposition (Bian et al, 2016), and sol-gel (Gatabi et al, 2017).…”
Section: Pzt Piezoelectric Filmsmentioning
confidence: 99%
“…The survey spectra of the two PZT surfaces reveal prominent characteristic peaks corresponding to the Pb 4f, Zr 3d, Ti 2p, and O 1s core levels. 36 , 37 The O 1s peak observed at ∼531 eV is attributed to oxygen atoms bonded within the PZT material. 38 This peak represents the energy required to excite electrons from the 1s orbital of oxygen atoms involved in chemical bonding within the PZT lattice structure.…”
Section: Resultsmentioning
confidence: 99%
“…Polarization dependence on the electric field strength (P-E loop measurements) was performed by means of the Sawyer and Tower method by supplying the created capacitor structure with up to 50 V AC sine voltages. The frequency was kept at 50 Hz during the measurements [30]. Multifunctional data acquisition (DAQ) NI USB-6361 device (National Instruments Corporation, Austin, TX, USA.)…”
Section: Methodsmentioning
confidence: 99%