2017
DOI: 10.1007/s10904-016-0492-6
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Structural, Morphological and Optical Properties of Nanostructure Nickel Oxide Thin Films on Quartz Substrates Grown by Plasma Oxidation

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Cited by 8 publications
(12 citation statements)
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“…In these samples, the microstrain and dislocation density increased with increasing the plasma treatment time while the crystallite size decreased. On the other hand, the average crystallite size of the films calculated from XRD data is found in the range of 29-41 nm, which confirms the presence of nanocrystals in the NiO films prepared in this study [7,24,28]. Based on these results, plasma oxidation can be suitable technique for producing the nanocrystalline NiO films.…”
Section: Resultssupporting
confidence: 76%
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“…In these samples, the microstrain and dislocation density increased with increasing the plasma treatment time while the crystallite size decreased. On the other hand, the average crystallite size of the films calculated from XRD data is found in the range of 29-41 nm, which confirms the presence of nanocrystals in the NiO films prepared in this study [7,24,28]. Based on these results, plasma oxidation can be suitable technique for producing the nanocrystalline NiO films.…”
Section: Resultssupporting
confidence: 76%
“…The peaks detected at binding energies of 855.8 eV and 862.1 eV are corresponding to Ni 2p 3/2 and Ni 2p 1/2 , respectively. These peaks suggest the presence of NiO [3,7,9,16]. The peak detected at 529.63 is belonging to O1 s and originates from the oxygen bond of Ni-O-Ni [7].…”
Section: Resultsmentioning
confidence: 99%
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