Structural phase transitions in bulk<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">YBa</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math><mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">Cu</mml:mi></mml:mrow><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math><mml:math xmlns:mml=

Poulsen, Henning Friis; Zimmermann, M. v.; Schneider, J. R.; Andersen, N.H.; Schleger, P.; Madsen, J.; Hadfield, R.; Casalta, H.; Liang, Ruixing; Dosanjh, P.; Hardy, W. N.

doi:10.1103/physrevb.53.15335

Cited by 19 publications

(7 citation statements)

References 41 publications

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“…In B1 and F1, they are aligned tangentially towards the rings which is the position, where the rings become narrowest. 1997a,b; Goorsky et al, 1999), structural phase transitions in the bulk of a material Poulsen et al, 1996;Wilkins et al, 2000;Lippmann and Schneider, 2000a,b;Arzel et al, 2002Arzel et al, , 2003Hatton et al, 2003) and their kinetics , diffuse diffraction from 'relaxor' ferroelectrics as discussed by (Zhukov et al, 1995), nonresonant magnetic diffraction (Lippert et al, 1994;Strempfer et al, 1996) and anomalous thermal expansion near a magnetic phase transition (Chatterji et al, 1998) are only a few of the applications which have successfully used this technique.…”

Section: Triple-axes Diffractometrymentioning

confidence: 99%

High‐Energy X‐Rays: A tool for Advanced Bulk Investigations in Materials Science and Physics

Liss

Bartels

Schreyer³

et al. 2003

Texture, Stress, and Microstructure

188

126

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High-energy X-rays between 30 keV and 1 MeV, such as provided by modern synchrotron radiation sources as the ESRF and HASYLAB, bear the advantage of high penetration into most materials. Even heavy element compositions can be accessed in their volume. The range of applications is huge and spreads from nuclear spectroscopy to the characterization of metal extrusion under industrial conditions. This article compiles an overview over the most common instrumental diffraction techniques.Modern two-dimensional detectors are used to obtain rapid overviews in reciprocal space. For example, diffuse scattering investigations benefit from the very flat Ewald sphere as compared to low energies, which allow mapping of several Brillouin zones within one single shot. Diffraction profiles from liquids or amorphous materials can be recorded easily. For materials science purposes, whole sets of Debye-Scherrer rings are registered onto the detector, their diameters and eccentricities or their intensity distribution along the rings relating to anisotropic strain or texture measurements, respectively. At this point we stress the resolution of this technique which has to be carefully taken into account when working on a second generation synchrotron source.Energy-dispersive studies of local residual strain can be studied by a dedicated three-circle diffractometer which allows accurately to adjust the scattering angle from a defined gauge volume.Triple axis diffractometry and reciprocal space mapping is introduced and can be employed for highest resolution purposes on single crystal characterization, even under heavy and dense sample environments. Thus, the perfection of single crystals can be mapped and strain fields and superstructures as introduced by the modulation from ultrasonic waves into crystals or epitaxially grown Si/Ge layers can be investigated in detail. Phase transitions as magnetic ordering can be studied directly or through its coupling to the crystal lattice. Time resolved studies are performed stroboscopically from a sub-nanosecond to a second time scale.The combination of these techniques is a strong issue for the construction and development of future instruments.

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Section: Triple-axes Diffractometrymentioning

confidence: 99%

High‐Energy X‐Rays: A tool for Advanced Bulk Investigations in Materials Science and Physics

Liss

Bartels

Schreyer³

et al. 2003

Texture, Stress, and Microstructure

188

126

View full text Add to dashboard Cite

show abstract

“…On the other hand, the diffracted intensity due to any weak scattering process will increase proportionally to the sample thickness. This has been of great advantage in the study of structural phase transitions (Rfitt et al, 1997;Poulsen et al, 1996) and ground-state magnetic properties of transition metal compounds (Strempfer et at., 1996) by means of highenergy synchrotron radiation. For a model study of the weak thermal diffuse scattering (TDS) in triple-crystal diffractometry with high-energy synchrotron radiation, perfect single crystals are ideal because TDS is enhanced with respect to the integrated reflecting power of the perfect crystal by about the ratio of t/text "~" 100, if a 1 cm-thick crystal diffracts in transmission geometry.…”

Section: A = T/tex T (1) Tex = [V/(rokfh) ]mentioning

confidence: 99%

Effect of Thermal Diffuse Scattering in Triple-Crystal Diffractometry with High-Energy Synchrotron Radiation

Schmidt¹,

Woo²,

Keitel³

et al. 1998

J Appl Cryst

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The thermal diffuse scattering around reflection 220 of a thick, perfect silicon crystal has been studied quantitatively by means of a triple-crystal diffractometer and 100 keV synchrotron radiation. The necessary fitting procedures were simplified by deriving an analytic solution to the instrumental resolution function for nondispersive setting of three perfect crystals. The temperature and e t dependence of the thermal diffuse scattering are very well described, taking only acoustical phonons into account; the contribution of optical phonons has been calculated explicitly.

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“…Oxygen ordering can engender charge transfer between the CuO x and CuO 2 planes, entailing a rise of the superconducting transition temperature T c . [4][5][6][7][8][9] Various theoretical models [10][11][12][13][14][15][16][17][18][19][20][21][22][23] and experimental techniques [23][24][25][26][27][28][29] have been used to study normal oxygen ordering in YBCO, from the disordering to the ordering critical temperature T c about 1000 K. In substoichiometric YBCO oxides (x < 1), other oxygen ordering transformations, such as ortho I to ortho II or ortho III, and so on also were demonstrated experimentally 23,30,31 and analyzed theoretically. 11,[13][14][15][16]18,22,32,33 However, another phase transformation, occurring about 220-280 K, which relates to the discontinuous change of material's lattice constants, 34 specific heat, 35,36 elastic stiffnesses, 37-40 electrical resistivity, 41 and dielectric constant, 42 h...…”

Section: Introductionmentioning

confidence: 99%

Oxygen reordering near room temperature inYBa2Cu3O6+x<

2011

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We propose a thermodynamic model to explain an unusual phase transformation occurring near room temperature in YBa 2 Cu 3 O 6+x that greatly affects properties of the superconductor. Based on our model, the material's thermodynamic response functions, specific heat, thermal-expansion coefficient, and elastic compliances are deduced at the critical temperature of the phase transformation. We discuss the change of critical temperature with stress, and analyze the anomaly of specific heat in critical temperature of the phase transformation.

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Structural phase transitions in bulkYBa2Cu3

Cited by 19 publications

References 41 publications

High‐Energy X‐Rays: A tool for Advanced Bulk Investigations in Materials Science and Physics

High‐Energy X‐Rays: A tool for Advanced Bulk Investigations in Materials Science and Physics

Effect of Thermal Diffuse Scattering in Triple-Crystal Diffractometry with High-Energy Synchrotron Radiation

Oxygen reordering near room temperature inYBa2Cu3O6+x<

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