2006
DOI: 10.1016/j.jcrysgro.2006.06.015
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Structural properties of thin films of the novel Cux(CdTe)yOz semiconductor system

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Cited by 6 publications
(2 citation statements)
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“…Also, Te precipitates may exist as nano-crystallites in a random distribution in CdTe and particularly they have at least two orders of magnitude larger scattering cross-section compared to that of CdTe. [41][42][43] Thus, it is difficult to compare Te and CdTe material content in film from their peak intensity as seen in Figure 3. However, the intensity of Te peak around 125 cm −1 is drastically increased for all the treated films signifying that the Te-rich surface is formed as an impact of thermal treatment.…”
Section: Resultsmentioning
confidence: 99%
“…Also, Te precipitates may exist as nano-crystallites in a random distribution in CdTe and particularly they have at least two orders of magnitude larger scattering cross-section compared to that of CdTe. [41][42][43] Thus, it is difficult to compare Te and CdTe material content in film from their peak intensity as seen in Figure 3. However, the intensity of Te peak around 125 cm −1 is drastically increased for all the treated films signifying that the Te-rich surface is formed as an impact of thermal treatment.…”
Section: Resultsmentioning
confidence: 99%
“…It has been reported that the addition of copper into the sputtered thin films of this semiconductor alloy Cu x Cd 1−x Te does not affect the CdTe crystalline structure [3,4]. Jimenez-Sandoval et al [5] observed that the presence of Cu tends to return the material to a crystalline state commonly observed in pure CdTe films. An important point that needs to be further explored in relation to the dopants is the lateral distribution that is related to intrinsic and extrinsic factors during the growing process, but this also affects its performance.…”
Section: Introductionmentioning
confidence: 99%